IP Library Granted Patent US 6,997,537
Granted Patent B2
US 6,997,537 · App. 10/963,559 · Granted Feb 14, 2006

Method of detecting a fault in a micro-electromechanical device

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Quick Facts
Patent No.
US 6,997,537
App. No.
10/963,559
Granted
Feb 14, 2006
Kind
B2
Abstract

A method of detecting a fault within a micro-electromechanical device includes the step of passing a series of predetermined current pulses through a movable component of the device to generate reciprocal displacement of the component. A predetermined extent of displacement of the component is detected. A performance characteristic of the device is determined based on a relationship between said predetermined current pulses and said predetermined extent of displacement of the component. A variation from said relationship during subsequent operational use of the device is sensed.

Claims (10)

1. A method of detecting a fault within a micro-electromechanical device comprising the steps of:

passing a series of predetermined current pulses through a movable component of the device to generate reciprocal displacement of the component;

detecting a predetermined extent of displacement of the component;

determining a performance characteristic of the device based on a relationship between said predetermined current pulses and said predetermined extent of displacement of the component; and

sensing a variation from said relationship during subsequent operational use of the device.

2. A method as claimed in claim 1 , in which the step of passing the series of predetermined current pulses through the movable component includes the step of passing the current pulses through an actuator arm of the device, the actuator arm being anchored at one end to a substrate and an opposite end being reciprocally displaceable with respect to the substrate on receipt of the current pulses.

3. A method as claimed in claim 1 , in which the step of detecting said predetermined extent of movement includes the step of detecting contact between a moving contact positioned on the movable component and a fixed contact positioned on the substrate and electrically connected to drive circuitry positioned on the substrate.

4. A method as claimed in claim 3 , in which the step of passing the series of current pulses through the movable component includes the step of applying the series of current pulses of increasing duration until contact between the moving contact and the fixed contact is detected.

5. A method as claimed in claim 1 , which includes the step of testing the device by applying the series of predetermined current pulses and detecting whether or not contact is made between the moving contact and the fixed contact.

6. A method as claimed in claim 5 , in which the step of testing the device includes the step of determining whether or not contact is made within a predetermined time period.

Assignments (3)
CHANGE OF NAME Recorded Dec 21, 2016
From: ZAMTEC LIMITED
To: MEMJET TECHNOLOGY LIMITED
Reel/Frame 041113/0557 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2013
From: SILVERBROOK RESEARCH PTY. LIMITED
To: ZAMTEC LIMITED
Reel/Frame 031506/0489 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 14, 2004
From: SILVERBROOK, KIA
To: SILVERBROOK RESEARCH PTY. LTD.
Reel/Frame 015898/0275 →