Polymer and photoresist compositions
View Patent ↗Disclosed are spirocyclic olefin polymers, methods of preparing spirocyclic olefin polymers, photresist compositions including spirocyclic olefin resin binders and methods of forming relief images using such photoresist compositions.
1. A polymer comprising as polymerized units
(i) one or more spirocyclic olefin monomers of formulae I or II
wherein Z=CH 2 , C(O), C(S), O or S; X and Y are independently chosen from CH 2 , C(O), C(S), O or NR 2 ; and R 2 =(C 1 –C 8 )alkyl or substituted (C 1 –C 8 )alkyl; provided that at least one of X, Y and Z is selected from C(O) and C(S); and
(ii) one or more cyclic olefin monomers having one or more substituent groups chosen from (C 1 –C 12 )halohydroxyalkyl; wherein the spirocyclic monomer is optionally substituted.
2. The polymer of claim 1 wherein the cyclic olefin monomer is chosen from cyclopentene, cyclopentadiene, dicylopentene, cyclohexene, cyclohexadiene, cycloheptene, cycloheptadiene, cyclooctene, cyclooctadiene, norbornene, and maleic anhydride.
3. The polymer of claim 1 wherein the (C 1 –C 12 )halohydroxyalkyl substituent is (CH 2 ) n ′C(CF 3 ) 2 OH where n′=0 to 4.
4. The polymer of claim 1 further comprising as polymerized units one or more cyclic olefin monomers having one or more substituent groups chosen from carbo(C 1 –C 20 )alkoxy and (CH 2 )n′C(CF 3 ) 2 —O-LG; wherein n′=0 to 4, wherein LG is a leaving group having 4 or more carbon atoms with at least one quaternary carbon atom bonded directly to the carboxyl group.
5. The polymer of claim 4 wherein the carbo(C 1 –C 20 )alkoxy substituent has the formula C(O)O-LG, wherein LG is a leaving group having 4 or more carbon atoms with at least one quaternary carbon atom bonded directly to the carboxyl group.
6. The polymer of claim 5 wherein the leaving group is chosen from isobutyl, 2,3-dimethylbutyl, 2,3,4-trimethylpentyl and alicyclic leaving groups.
7. A photoresist composition comprising one or more polymers of claim 1 and one or more photoactive components.
8. The photoresist of claim 7 wherein the photoactive component is chosen from photoacid generators and photobase generators.
9. A method of forming a relief image comprising the steps of applying a coating layer of the photoresist composition of claim 8 , exposing the photoresist coating layer to patterned actinic radiation; and developing the exposed photoresist coating layer to provide a relief image.