PICA system timing measurement and calibration
View Patent ↗PICA probe system apparatus is described, including apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measurement capability in which time between boundaries is interpolated using a voltage ramp.
1. A PICA probe system comprising:
a. A PICA collection camera;
b. Acquisition electronics responsive to strobe pulses from the PICA collection camera representing photon-detection events for collecting data about the photon-detection events, said acquisition electronics comprising:
i. an input for receiving trigger pulses from a test loop, said trigger pulses having a defined trigger period;
ii. an oscillator generatng clock pulses having a clock period shorter than the trigger period;
iii. a coarse-measurement counter for counting clock pulses between strobe pulses and trigger pulses; and,
iv. a fine-measurement interpolator measuring a time delay of less than one clock period; and
c. A workstation having a processor in communication with the PICA collection camera and the acquisition electronics for controlling operation and for processing data collected by the acquisition electronics.
2. The system of claim 1 , wherein said fine-measurement interpolator further comprises a voltage ramp and an analog-to-digital converter for sampling the voltage ramp at a plurality of known times relative to the clock pulses to obtain voltage samples from which slope of the voltage ramp can be calculated.
3. The apparatus of claim 2 , further comprising a phase-locked loop to maintain the trigger pulses and the clock pulses in a defined phase relationship.
4. The apparatus of claim 1 , wherein the fine-measurement interpolator measures a time period from a strobe pulse to next clock pulse.
5. The apparatus of claim 1 , wherein the fine-measurement interpolator measures a time period from a trigger pulse to next clock pulse.
6. The apparatus of claim 4 , further comprising a second fine-measurement interpolator measuring a time period from a trigger pulse to next clock pulse.
7. The apparatus of claim 5 , further comprising a second fine-measurement interpolator measuring a time period from a strobe pulse to next clock pulse.
8. An electronic timer system for timing light emissions from devices in integrated circuits, comprising:
a trigger input for receiving trigger pulses from a looping vector applied to the integrated circuit, said trigger pulses having a defined trigger period;
a strobe input for receiving strobe pulses corresponding to the light emission from the integrated circuit;
an oscillator generating clock pulses having a clock period shorter tan the trigger period;
a coarse-measurement counter counting clock pulses between strobe pulses and trigger pulses and outputting clock count;
a fine-measurement interpolator measuring a first time period from a trigger pulse to next clock pulse and a second time period from a strobe pulse to next clock pulse; and, an arithmetic unit receiving the clock count, the first time period and the second time period and generating a timing signal thereform.
9. The timer system of claim 8 , wherein the fine-measurement interpolator comprises a first time to voltage converter generating voltage corresponding to the first time period and a second time to voltage converter generating voltage corresponding to the second time period.
10. The timer system of claim 8 , further comprising a phase lock loop coupling the trigger pulses and the clock pulses.