System, method and storage medium for providing a high speed test interface to a memory subsystem
View Patent ↗A buffer device for testing a memory subsystem. The buffer device includes a parallel bus port adapted for connection to a slow speed bus and a serial bus port adapted for connection to a high speed bus. The high speed bus operates at a faster speed than the slow speed bus. The buffer device also includes a bus converter having a standard operating mode for converting serial packetized input data received via the serial bus port into parallel bus output data for output via the parallel bus port. The buffer device also includes an alternate operating mode for converting parallel bus input data received via the parallel bus port into serial packetized output data for output via the serial bus port. The serial packetized input data is consistent in function and timing to the serial packetized output data.
1. A method for creating test data for testing a packetized cascade memory subsystem, the method comprising:
receiving test data at a bus converter, the test data in a parallel bus data format and received via a slow speed bus;
converting the test data into a serial packetized data format at the bus converter, the converting the test data resulting in converted test data; and
transmitting the converted test data from the bus converter to the memory subsystem via a high speed bus, wherein the high speed bus operates at a faster speed than the slow speed bus,
wherein the bus converter includes a standard operating mode for converting serial packetized input data received via the high speed bus into parallel bus output data for output to the slow speed bus and an alternate operating mode for the converting the test data into the serial packetized data format, and wherein the serial packetized input data is consistant in function and timing to the converted test data.
2. The method of claim 1 wherein the high speed bus operates at four times the speed of the slow speed bus.
3. The method of claim 1 wherein the test data is received from a tester device operating at the same speed as the slow speed bus.
4. The method of claim 1 wherein the high speed bus operates at the same speed as the memory subsystem.
5. The method of claim 1 further comprising:
receiving test result data from the memory subsystem via the high speed bus, wherein the test result data from the memory subsystem via the high speed bus, wherein the test result data is responsive to the test data and is in the serial packetized data format;
converting the test result data into the parallel bus data format resulting in converted test result data; and
transmitting the converted test result data to a tester device via the slow speed bus.
6. The method of claim 1 wherein the memory subsystem includes a memory device operating at the speed of the slow speed bus and an other bus converter for receiving the converted test data and for converting the test data into the parallel bus data input format for communication with the memory device.