IP Library Granted Patent US 7,159,057
Granted Patent B2
US 7,159,057 · App. 10/989,025 · Granted Jan 2, 2007

Evaluation chip

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Quick Facts
Patent No.
US 7,159,057
App. No.
10/989,025
Granted
Jan 2, 2007
Kind
B2
Abstract

An evaluation chip is disclosed whose interrupt priority order can be changed freely. A plurality of interrupt priority order determining circuits 20 - 1 to 2 - 4 perform a logical operation on a plurality of signals S 11 to S 14 used for interrupt priority order modifying control that are applied from outside and a plurality of interrupt signals S 31 - 1 to S 31 - 4 , and output interrupt modifying signals S 24 - 1 to S 24 - 4 . A plurality of interrupt modules 30 - 1 to 30 - 4 perform a logical AND operation on the plurality of signals S 24 - 1 to S 24 - 4 and a plurality of interrupt request signals S 15 - 1 to S 15 - 4 that are applied from outside, and output the signals S 31 - 1 to S 31 - 4 . An address generating circuit 40 encodes the plurality of signals S 31 - 1 to S 31 - 4 and generates interrupt vector addresses 40 . A microcomputer core 50 executes interrupt instructions that have been fetched from an external program memory 100 , based on the addresses S 40.

Claims (30)

1. An evaluation chip comprising:

a plurality of interrupt priority order determining circuits being configured to perform a logical operation on a plurality of control signals used for interrupt priority order modifying control and a plurality of interrupt signals, said plurality of control signals being applied from outside said evaluation chip, each of said plurality of interrupt priority determining circuits being configured to output an interrupt modifying signal;

a plurality of interrupt signal generating circuits being configured to perform a logical operation on a plurality of said interrupt modifying signals and a plurality of interrupt request signals being applied from outside said evaluation chip, said plurality of interrupt signal generating circuits being configured to output said interrupt signals;

an interrupt vector address generating circuit being configured to encode said plurality of interrupt signals and to generate interrupt vector addresses; and

an instruction executing device being configured to decode interrupt instructions having been received in a priority order from outside said evaluation chip and to encode successively decoded results based on said interrupt vector addresses.

2. The evaluation chip according to claim 1 , wherein said plurality of control signals is input from external control signal input terminals.

3. The evaluation chip according to claim 2 , wherein said instruction executing device includes a control portion, an operation portion, a register portion, and a memory.

4. The evaluation chip according to claim 3 , wherein said operation portion includes an arithmetic logic unit configured to execute arithmetic operations and an accumulator configured to store data temporarily.

5. The evaluation chip according to claim 4 , wherein said memory is random access memory.

6. The evaluation chip according to claim 5 , wherein write data that are written into the accumulator, write data of the random access memory, and write addresses for the random access memory are output through a data bus to at least one output terminal.

7. An evaluation chip comprising:

a plurality of priority order control registers being configured to generate a plurality of control signals based on data that are applied from outside said evaluation chip;

a plurality of interrupt priority order determining circuits being configured to perform a logical operation on said plurality of control signals used for interrupt priority order modifying control and a plurality of interrupt signals, each of said plurality of interrupt priority determining circuits being configured to output an interrupt modifying signal;

a plurality of interrupt signal generating circuits being configured to perform a logical operation on a plurality of said interrupt modifying signals and a plurality of interrupt request signals being applied from outside said evaluation chip, said plurality of interrupt signal generating circuits being configured to output said interrupt signals;

an interrupt vector address generating circuit being configured to encode said plurality of interrupt signals and to generate interrupt vector addresses; and

an instruction executing device being configured to decode interrupt instructions having been received in a priority order from outside said evaluation chip and to encode successively decoded results based on said interrupt vector addresses.

8. The evaluation chip according to claim 7 , wherein said instruction executing device includes a control portion, an operation portion, a register portion, and a memory.

9. The evaluation chip according to claim 8 , wherein said operation portion includes an arithmetic logic unit configured to execute arithmetic operations and an accumulator configured to store data temporarily.

10. The evaluation chip according to claim 9 , wherein said memory is random access memory.

11. The evaluation chip according to claim 10 , wherein write data that are written into the accumulator, write data of the random access memory, and write addresses for the random access memory are output through a data bus to at least one output terminal.

12. An evaluation chip comprising:

an interrupt priority order control shift register being configured to generates a plurality of control signals based on serial data that are applied from outside said evaluation chip during power-on;

a plurality of interrupt priority order determining circuits being configured to perform a logical operation on said plurality of control signals used for interrupt priority order modifying control and a plurality of interrupt signals, each of said plurality of interrupt priority determining circuits being configured to output an interrupt modifying signal;

a plurality of interrupt signal generating circuits being configured to perform a logical operation on a plurality of said interrupt modifying signals and a plurality of interrupt request signals being applied from outside said evaluation chip, said plurality of interrupt signal generating circuits being configured to output said interrupt signals;

an interrupt vector address generating circuit being configured to encode said plurality of interrupt signals and to generate interrupt vector addresses; and

an instruction executing device being configured to decode interrupt instructions having been received in a priority order from outside said evaluation chip and to encode successively decoded results based on said interrupt vector addresses.

13. The evaluation chip according to claim 12 , wherein said instruction executing device includes a control portion, an operation portion, a register portion, and a memory.

14. The evaluation chip according to claim 13 , wherein said operation portion includes an arithmetic logic unit configured to execute arithmetic operations and an accumulator configured to store data temporarily.

15. The evaluation chip according to claim 14 , wherein said memory is random access memory.

16. The evaluation chip according to claim 15 , wherein write data that are written into the accumulator, write data of the random access memory, and write addresses for the random access memory are output through a data bus to at least one output terminal.

Assignments (4)
CHANGE OF NAME Recorded Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →
CHANGE OF NAME Recorded Dec 24, 2008
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022052/0797 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED AT REEL 016000 FRAME 0925. ASSIGNOR CONFIRMS THE ASSIGNMENT. Recorded May 25, 2005
From: YAMASAKI, HIROSHI; NAGATOMO, KENICHIRO
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 016612/0730 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2004
From: YAMASAKI, HIROSHI; NAGATOMO, KENICHIRO
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 016000/0925 →