Measuring pyramid size on a textured surface
View Patent ↗A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, which method involves emitting from a light source a light beam along a first direction onto a region of the textured surface, measuring an intensity of light received from that region along a second direction, and processing the measured intensity to obtain an average size of pyramids; and a device suitable for measuring pyramid size according to the method.
1. A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, the method comprising:
emitting from a light source a light beam along a first direction onto a region of the textured surface;
measuring an intensity of light reflected from said region along a second direction; and
providing a processor, said processor processing the measured intensity to determine an average size of pyramids, said average size of pyramids being determined by using a predetermined relationship between the intensity of light received along the second direction and pyramid size, wherein the pyramid size increases with increasing intensity of received light.
2. The method according to claim 1 , wherein the first and second directions deviate from the direction normal to the textured surface.
3. The method according to claim 1 , wherein the light beam is a beam of plane waves.
4. The method according to claim 1 , wherein the first and second directions are substantially collinear.
5. The method according to claim 3 , wherein the first and second directions deviate from the direction normal to the textured surface, and wherein the first and second directions are substantially collinear.
6. A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, the method comprising:
emitting a light beam along a first direction onto a region of the textured surface;
measuring an intensity of light received from said region along a second direction; and
providing a processor, said processor processing the measured intensity to obtain an average size of pyramids, said first direction and said second direction deviating from a direction normal to the textured surface by more than 10 degrees, said average size of pyramids being determined by using a predetermined relationship between the intensity of light received along the second direction and pyramid size, wherein the pyramid size increases with increasing intensity of received light.
7. The method according to claim 6 , wherein the first and second directions are substantially collinear.
8. A method for measuring pyramid size of pyramids outwardly extending on a textured surface of an object, the method comprising:
emitting from a light source a light beam along a first direction onto a region of the textured surface;
measuring an intensity of light reflected from said region along a second direction, wherein the position of the object and/or the first direction of incident light, and/or the second direction along which the intensity of light is measured are adjusted such that the intensity of the light received along the second direction is maximized; and
providing a processor, said processor processing the measured intensity to determine an average size of pyramids, said average size of pyramids being determined by using a predetermined relationship between the intensity of light received along the second direction and pyramid size, wherein the pyramid size increases with increasing intensity of received light.
9. The method according to claim 8 , wherein the first and second directions deviate from the direction normal to the textured surface.
10. The method according to claim 8 , wherein the light beam is a beam of plane waves.
11. The method according to claim 10 , wherein the first and second directions deviate from the direction normal to the textured surface, and wherein the first and second directions are substantially collinear.
12. The method according to claim 8 , wherein the first and second directions are substantially collinear.
13. The method according to claim 6 , wherein the first and second directions deviate from the direction normal to the textured surface.
14. The method according to claim 6 , wherein the light beam is a beam of plane waves.
15. The method according to claim 14 , wherein the first and second directions deviate from the direction normal to the textured surface.
16. The method according to claim 1 , further comprising providing an object holder for holding the object and a detector for measuring said intensity of light reflected from said region along said second direction.
17. The method according to claim 1 , further comprising providing a system to change the position of the object and/or the light source and/or the second direction of light such that the intensity of the light received along the second direction is maximized.
18. The method according to claim 16 , wherein the light source and the detector are fixed to each other.
19. The method according to claim 16 , wherein said object holder is rotatable about an axis perpendicular to said first direction and said second direction.
20. The method according to claim 8 , further comprising providing a system to change the position of the object and/or the light source and/or the second direction of light such that the intensity of the light received along the second direction is maximized.