Systems and methods for self-calibration
View Patent ↗A self-calibrating integrated circuit includes a processor having at least one analog function used with the processor; one or more sensors adapted to sense one or more environmental parameters of the at least one analog function; and a solid state memory being configured to store the one or more environmental parameters of the at least one analog function.
1. An integrated circuit, comprising:
a radio frequency circuit configured to communicate radio frequency data;
one or more sensors configured to sense one or more environmental parameters; and
a memory configured to store sensed information regarding the one or more environmental parameters.
2. The integrated circuit of claim 1 , further comprising a processor coupled to the radio frequency circuit.
3. The integrated circuit of claim 2 , wherein the processor is configured to monitor the one or more sensors.
4. The integrated circuit of claim 3 , further comprising an oscillator coupled to the radio frequency circuit.
5. The integrated circuit of claim 4 , wherein the processor is configured to adjust the oscillator based on the monitoring.
6. The integrated circuit of claim 1 , wherein the one or more environmental parameters includes at least one of temperature and supply voltage.
7. The integrated circuit of claim 1 , wherein the one or more sensors include one or more hot-electron sensors.
8. The integrated circuit of claim 1 , further comprising one or more hot-electron generators.
9. A method comprising:
sensing at least one environmental parameter associated with a semiconductor device having an analog portion including a radio frequency circuit configured to communicate radio frequency data and a digital portion; and
controlling a clock frequency based on the sensed at least one environmental parameter.
10. The method of claim 9 , further comprising comparing the sensed at least one environmental parameter to a predetermined value for the at least one environmental parameter stored in a memory.
11. The method of claim 9 , further comprising adjusting the clock frequency using an oscillator on the semiconductor device.
12. The method of claim 9 , wherein sensing the at least one environmental parameter comprises sensing a hot-electron effect of the semiconductor device.
13. The method of claim 9 , further comprising adjusting a temperature of the semiconductor device if a sensed temperature is below a predetermined value.
14. The method of claim 9 , further comprising generating the clock frequency on the semiconductor device.
15. A system comprising:
a processor;
a radio frequency circuit coupled to the processor;
an oscillator coupled to the processor and the radio frequency circuit, the oscillator having a frequency varied by one or more environmental parameters; and
one or more sensors configured to sense the one or more environmental parameters, wherein at least one of the sensors comprises a hot-electron sensor.
16. The system of claim 15 , further comprising a memory configured to store information regarding the one or more environmental parameters.
17. The system of claim 15 , wherein the processor is configured to monitor the one or more sensors.
18. The system of claim 17 , wherein the processor is configured to adjust the oscillator based on the monitoring.
19. The system of claim 16 , wherein the memory is configured to store self-calibration data for the oscillator.
20. The system of claim 15 , wherein the processor is configured to predict changes to the one or more environmental parameters based on historical data.