IP Library Granted Patent US 7,230,807
Granted Patent B2
US 7,230,807 · App. 11/012,705 · Granted Jun 12, 2007

Protection circuit for a transistor

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Quick Facts
Patent No.
US 7,230,807
App. No.
11/012,705
Granted
Jun 12, 2007
Kind
B2
Abstract

A protection circuit for transistor that avoids the use of performance hindering resistors or diodes or capacitors includes a routing circuit for routing an electrostatic discharge current around the transistor and a detection circuit that switches on the routing circuit when a breakdown current in the transistor exceeds a threshold.

Claims (17)

1. A protection circuit for a transistor comprising:

routing circuit for routing an electrostatic discharge current around the transistor;

detection circuit that switches on the routing circuit by detecting a breakdown current in the transistor;

wherein the detection circuit comprises a resistor coupled between a node and a gate of the transistor.

2. The protection circuit of claim 1 , wherein the resistor is selected in response to an amount of current in the gate that is significant but not destructive to the transistor.

3. A protection circuit for a transistor comprising:

routing circuit for routing an electrostatic discharge current around the transistor;

detection circuit that switches on the routing circuit by detecting a breakdown current in the transistor;

a bypass circuit that enables an AC signal to bypass the detection circuit into the transistor.

4. The protection circuit of claim 3 , wherein the bypass circuit comprises a capacitor.

5. The protection circuit of claim 4 , wherein the capacitor is selected in response to a lowest operating frequency for the transistor.

6. A method for protecting a transistor from an electrostatic discharge current comprising detecting when a breakdown current in the transistor caused by the electrostatic discharge current exceeds a threshold and then routing the electrostatic discharge current around the transistor wherein detecting comprises developing a voltage drop across a component.

7. The method of claim 6 , wherein developing comprises developing across a resistor.

8. The method of claim 7 , further comprising selecting the resistor in response to an amount of current in the gate that is significant but not destructive to the transistor.

9. A method for protecting a transistor from an electrostatic discharge current comprising detecting means detecting when a breakdown current in the transistor caused by the electrostatic discharge current exceeds a threshold and then routing the electrostatic discharge current around the transistor, further comprising enabling an AC signal to bypass the detecting means into the transistor.

10. The method of claim 9 , wherein bypassing comprises bypassing using a capacitor.

11. The method of claim 10 , further comprising selecting the capacitor in response to a lowest operating frequency for the transistor.

Assignments (5)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 017206 FRAME: 0666. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2016
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 038632/0662 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2006
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD
To: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
Reel/Frame 017675/0434 →
SECURITY AGREEMENT Recorded Feb 24, 2006
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: CITICORP NORTH AMERICA, INC.
Reel/Frame 017207/0882 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 22, 2006
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES GENERAL IP PTE. LTD.
Reel/Frame 017206/0666 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2005
From: VICE, MICHAEL W
To: AGILENT TECHNOLOGIES, INC.
Reel/Frame 015963/0363 →