Polarization controlling fiber probe for semiconductor source spectroscopy system
View Patent ↗A semiconductor source spectroscopy system controls optical power variation of the tunable signal due to polarization dependent loss in the system and thus improves the noise performance of the system. It relies on using polarization control between the source and the sample and/or the sample and the detector. In one example, the source has a semiconductor optical amplifier and an intracavity tunable element for generating a tunable optical signal for illuminating a sample. The tunable optical signal is spectrally tuned over a scan band of the spectroscopy system by operation of the intracavity tunable element.
1. A semiconductor source spectroscopy system, comprising:
a tunable semiconductor source comprising a semiconductor optical amplifier and an intracavity tunable element for generating a tunable optical signal for illuminating a sample, the tunable optical signal being spectrally tuned over a scan band of the spectroscopy system by operation of the intracavity tunable element;
a detector for detecting a signal from a sample generated by the illumination of the sample by the tunable optical signal of the semiconductor source; and
polarization controlling fiber in the optical link between the semiconductor source and the detector.
2. A system as claimed in claim 1 , wherein the polarization controlling fiber is polarization maintaining fiber.
3. A system as claimed in claim 1 , wherein the polarization controlling fiber is optical fiber that propagates only a single polarization.
4. A system as claimed in claim 1 , wherein the intracavity tunable element is a Fabry-Perot tunable filter.
5. A system as claimed in claim 1 , wherein the intracavity tunable element is a microelectromechanical Fabry-Perot tunable filter.
6. A system as claimed in claim 1 , wherein the intracavity tunable element is a grating.
7. A spectroscopy method, comprising:
generating a highly polarized tunable optical signal for illuminating a sample using a tunable semiconductor source comprising a semiconductor optical amplifier and an intracavity tunable element;
transmitting the highly polarized tunable optical signal through a first polarization controlling fiber pigtail;
coupling the highly polarized tunable optical signal from the first polarization controlling fiber pigtail to a second polarization controlling fiber pigtail;
illuminating a sample with the highly polarized tunable optical signal from the second polarization controlling fiber pigtail;
detecting a signal from the sample generated by the illumination of the sample by highly polarized tunable optical signal from the semiconductor source to determined a spectral response of the sample.
8. A system as claimed in claim 1 , wherein the polarization controlling fiber comprises a first polarization controlling fiber pigtail from tunable semiconductor source.
9. A system as claimed in claim 8 , wherein the polarization controlling fiber further comprises a second polarization controlling fiber pigtail for transmitting the tunable optical signal, which was received from the first polarization controlling fiber pigtail, to the sample.
10. A system as claimed in claim 9 , further comprising a fiber coupler for coupling the first polarization controlling fiber pigtail to the second polarization controlling fiber pigtail.