Heterojunction photodiode
View Patent ↗The present invention provides a heterojunction photodiode which includes a pn or Schottky-barrier junction formed in a first material region having a bandgap energy E g1 . When reverse-biased, the junction creates a depletion region which expands towards a second material region having a bandgap energy E g2 which is less than E g1 . This facilitates signal photocurrent generated in the second region to flow efficiently through the junction in the first region while minimizing the process-related dark currents and associated noise due to near junction defects and imperfect surfaces which typically reduce photodiode device performance. The heterojunction photodiode can be included in an imaging system which includes an array of junctions to form an imager.
1. A heterojunction photodiode, comprising:
a pn or Schottky-barrier junction formed in a first material region having a bandgap energy E g1 ; and
a second material region having a bandgap energy E g2 which is less than E g1 positioned adjacent to said first material region, the material of said second material region characterized in that dark currents through said second material region are limited by fundamental Auger processes, said junction creating a depletion region in said first material region which expands towards said second material region in response to a reverse bias voltage such that the dark current flowing through said junction is reduced, said photodiode arranged such that said depletion region extends into said second material region when said reverse bias voltage is greater than a predetermined value;
wherein said photodiode is arranged such that said second material region is thin enough such that it is fully depleted by said depletion region, thereby minimizing dark currents associated with fundamental Auger processes.
2. The system of claim 1 , wherein said second material region comprises mercury cadmium telluride (HgCdTe) or alloys thereof.
3. The system of claim 1 , wherein said first material region comprises cadmium telluride (CdTe) or alloys thereof.
4. A heterojunction photodiode, comprising:
a pn or Schottky-barrier junction formed in a first material region having a bandgap energy E g1 ; and
a second material region having a bandgap energy E g2 which is less than E g1 positioned adjacent to said first material region, the material of said second material region characterized in that dark currents through said second material region are limited by fundamental Auger processes, said junction creating a depletion region in said first material region which expands towards said second material region in response to a reverse bias voltage such that the dark current flowing through said junction is reduced, the photodiode arranged such that said depletion region extends into said second material region when said reverse bias voltage is greater than a predetermined value;
wherein said photodiode is arranged such that said depletion region extends into and across said second material region such that said second material region is fully depleted, thereby minimizing dark currents associated with fundamental Auger processes.
5. The system of claim 4 , wherein said second material region comprises mercury cadmium telluride (HgCdTe) or alloys thereof.
6. The system of claim 4 , wherein said first material region comprises cadmium telluride (CdTe) or alloys thereof.
7. An imaging system, comprising:
an array of pn or Schottky-barrier junctions formed in a first material region having a bandgap energy E g1 ; and
a second material region having a bandgap energy E g2 which is less than E g1 positioned adjacent to said first material region, the material of said second material region characterized in that dark currents through said second material region are limited by fundamental Auger processes, each pn junction creating a depletion region in said first material region which expands towards said second material region in response to a reverse bias voltage to reduce said imaging system's dark current, said junctions arranged such that said depletion regions extend into said second material region when said reverse bias voltage is greater than a predetermined value, each of said junctions arranged such that its depletion region extends into said second material region such that said second material region is fully depleted, thereby minimizing dark currents associated with fundamental Auger processes.
8. The system of claim 7 , wherein said junctions provide respective photocurrents in response to incident infrared light.
9. The system of claim 8 , further including external electronic circuitry which receives said photocurrents and provides electrical output signals corresponding to an image formed on said array of pn junctions from said incident light.
10. The system of claim 7 , wherein said second material region comprises mercury cadmium telluride (HgCdTe) or alloys thereof.
11. The system of claim 7 , wherein said first material region comprises cadmium telluride (CdTe) or alloys thereof.
12. A heterojunction photodiode, comprising:
a pn or Schottky-barrier junction formed in a first material region, said first material region comprising cadmium telluride (CdTe) or alloys thereof and having a bandgap energy E g1 ; and
a second material region positioned adjacent to said first material region, said second material region comprising mercury cadmium telluride (HgCdTe) or alloys thereof and having a bandgap energy E g2 which is less than E g1 , said junction creating a depletion region in said first material region which expands towards said second material region in response to a reverse bias voltage such that the dark current flowing through said junction is reduced, said photodiode arranged such that said depletion region extends into said second material region when said reverse bias voltage is greater than a predetermined value;
wherein said photodiode is arranged such that said second material region is thin enough such that it is fully depleted by said depletion region, thereby minimizing dark currents associated with fundamental Auger processes.