IP Library Granted Patent US 7,714,284
Granted Patent B2
US 7,714,284 · App. 11/035,800 · Granted May 11, 2010

Methods and apparatus for enhanced sample identification based on combined analytical techniques

Assignee: Sionex Corporation
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Quick Facts
Patent No.
US 7,714,284
App. No.
11/035,800
Granted
May 11, 2010
Kind
B2
Abstract

The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample detection using multiple detection and analytical techniques in combination.

Claims (48)

1. A method for identifying a constituent in a sample comprising,

measuring a differential field mobility characteristic as a function of a varying RF electric field strength for the sample to determine an ion mobility signature for the sample, and

identifying the constituent by at least comparing the determined ion mobility signature of the sample with a data library containing at least one known ion mobility signature for a known constituent.

2. The method of claim 1 comprising employing a DMS for determining the ion mobility signature for the sample.

3. The method of claim 1 comprising employing an IMS for measuring a low field ion mobility coefficient for the sample.

4. The method of claim 1 comprising employing a modulated electric field voltage for measuring a low field ion mobility coefficient for the sample.

5. The method of claim 1 comprising,

determining concurrently the ion mobility signature for the sample for both negative and positive mode ions,

measuring a low field ion mobility coefficient for the sample for both the negative and positive mode ions, and

determining a total coefficient of mobility for both the positive and negative mode ions.

6. The method of claim 1 comprising,

operating an ion mobility analyzer in a first mode to determine the ion mobility signature for the sample, and

operating the ion mobility analyzer in a second mode to measure a low field ion mobility coefficient for the sample.

7. The method of claim 6 , wherein the first mode is a DMS mode and the second mode is an IMS mode.

8. A method for identifying a constituent in a sample comprising,

measuring a first ion mobility characteristic for the sample using a DMS analyzer,

measuring a second ion mobility characteristic for the sample using a first IMS analyzer, and

identifying the constituent by comparing the measured first and second ion mobility characteristics with a data library of known first and second ion mobility characteristics.

9. The method of claim 8 comprising identifying the constituent based at least in part on a combination of both the first and second ion mobility characteristics.

10. The method of claim 8 , wherein the ion mobility characteristic includes at least one of an ion intensity spectrum and a high field mobility coefficient.

11. The method of claim 8 comprising employing a detector of the DMS analyzer as a shutter for gating ions into the first IMS analyzer.

12. The method of claim 8 comprising exhausting neutral molecules from the DMS analyzer without introducing the neutral molecules into the first IMS analyzer.

13. A system for identifying a constituent in a sample comprising,

a first analyzer for measuring a differential field mobility characteristic as a function of a varying RF electric field strength and determining an ion mobility signature for the sample,

a data store for storing a library of at least one known ion mobility signature associated with a known constituent, and

a processor for identifying the constituent based at least in part on comparing the determined ion mobility signature with the library of at least one known ion mobility signature.

14. The system of claim 13 , wherein the first analyzer includes a DMS.

15. The system of claim 13 comprising a second analyzer for measuring a low field ion mobility characteristic for the sample ,wherein the second analyzer includes an IMS.

16. A system for identifying a constituent in a sample comprising,

a DMS analyzer for measuring a first ion mobility characteristic for the sample,

a first IMS analyzer for measuring a second ion mobility characteristic for the sample, and

a processor for identifying the constituent by comparing the measured first and second ion mobility characteristics with a data library of known first and second ion mobility characteristics.

17. The system of claim 16 , wherein the processor identifies the constituent based at least in part on a combination of both the first and second ion mobility characteristics.

18. The system of claim 16 , wherein the processor selects, based at least in part on a mass of the sample, either the first or the second ion mobility characteristic for use in identifying the constituent.

19. The system of claim 16 , wherein the DMS includes a detector operated as a shutter for gating ions into the first IMS analyzer.

20. The system of claim 16 , wherein the system includes an outlet for exhausting neutral molecules from the DMS analyzer without introducing the neutral molecules into the first IMS analyzer.

21. The system of claim 16 comprising,

a second IMS analyzer for measuring a third ion mobility characteristic, wherein the processor identifies the constituent based at least in part on the first, second and third ion mobility characteristics.

22. The system of claim 21 , wherein the second ion mobility characteristic is a positive mode characteristic and the third ion mobility characteristic is a negative mode characteristic.

23. The system of claim 16 , wherein the first and second analyzers measure the first and second ion mobility characteristics concurrently.

24. A portable device for identifying a constituent in a sample comprising,

a chip-based analyzer for measuring a mobility characteristic as a function of a varying RF electric field strength for the sample to determine an ion mobility signature for the sample, and

a processor for identifying the constituent based at least in part on comparing the determined ion mobility signature for the sample with a data store including at least one known ion mobility signature for a known sample.

25. The device of claim 24 , wherein the analyzer includes a DMS.

26. The method of claim 1 , wherein the ion mobility signature includes a device-independent ion mobility signature.

27. The method of claim 1 , wherein the ion mobility signature is based at least in part on a high field mobility coefficient.

28. The system of claim 13 , wherein the ion mobility signature includes a device-independent ion mobility signature.

29. The system of claim 13 , wherein the ion mobility signature is based at least in part on a high field mobility coefficient.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2010
From: SIONEX CORPORATION
To: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
Reel/Frame 025114/0444 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 22, 2005
From: MILLER, RAANAN A.; NAZAROV, ERKINJON G.; KAUFMAN, LAWRENCE A.; KRYLOV, EVGENY; EICEMAN, GARY A.
To: SIONEX CORPORATION
Reel/Frame 016136/0020 →
Continuity (10)
Continuation In Part 1073896700 · Dec 17, 2003
Continuation In Part 1018746400 · Jun 28, 2002
Continuation In Part 0989653600 · Jun 30, 2001
Provisional Application 6034089400 · Oct 30, 2001
Provisional Application 6034090400 · Dec 12, 2001
Provisional Application 6034258800 · Dec 20, 2001
Provisional Application 6035104300 · Jan 23, 2002
Provisional Application 6033468500 · Nov 15, 2001
Provisional Application 6053618200 · Jan 13, 2004
Related Publication 20050173629A1 · Aug 11, 2005