Measurement of sample reflectance
View Patent ↗An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.
1. An accessory for use with a spectrometer to enable reflectance measurements to be made on a sample, said accessory comprising:
a housing defining a sample location,
a first reflector for receiving analyzing radiation propagating generally horizontally and for reflecting the radiation at least partially upwardly to a second reflector,
a third reflector for receiving radiation from the second reflector and for directing the radiation along a generally horizontal path which is horizontally displaced relative to that of the incoming radiation,
a fourth reflector for directing the radiation towards the sample location, said fourth reflector being rotatable and translatable by at least one first motor, and
a detector located in said housing for receiving radiation reflected from the sample, wherein the detector is movable along an arc and linearly translatable by at least one second motor; and
wherein said at least one first motor and said at least one second motor can position said fourth reflector and said detector such that the radiation is incident on the sample at a number of different angles of incidence and also to provide a configuration in which the radiation is directed to the detector without being incident on the sample.
2. An accessory according to claim 1 , wherein the direction of radiation propagating from the third reflector is generally opposite to that of the incoming radiation.
3. An accessory according to claim 1 , wherein the third reflector is a roof mirror.
4. An accessory according to claim 3 , wherein the third reflector is movable linearly so that it can act as a path length compensator.