IP Library Granted Patent US 7,310,507
Granted Patent B2
US 7,310,507 · App. 11/043,985 · Granted Dec 18, 2007

Filter circuit permitting adjustment of cutoff frequency

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,310,507
App. No.
11/043,985
Granted
Dec 18, 2007
Kind
B2
Abstract

A filter circuit, having a plurality of selectable impedance elements, that has a cutoff frequency dependent on a selected impedance element, comprises a pulse generation circuit that supplies a variable frequency pulse with a successively increasing or decreasing frequency to an input of the filter circuit; and an impedance element selection unit that checks the attenuation of the output pulse of the filter circuit corresponding with the input of the variable frequency pulse and selects the plurality of impedance elements on the basis of the position of a pulse that is attenuated to or below a reference value.

Claims (21)

1. A filter circuit, having a plurality of selectable impedance elements, that has a cutoff frequency dependent on a selected impedance element, comprising:

a filter processing circuit that transmits a signal with a frequency range based on the cutoff frequency;

a pulse generation circuit that supplies a variable frequency pulse with a successively increasing or decreasing frequency to an input of the filter processing circuit; and

an impedance element selection unit that checks an attenuation of an output pulse of the filter processing circuit corresponding with the input of the variable frequency pulse and selects the plurality of impedance elements on the basis of the position of a pulse that is attenuated to or below a reference value.

2. The filter circuit according to claim 1 , wherein the impedance element is a resistor element or capacitor element.

3. The filter circuit according to claim 1 , wherein the impedance element selection unit includes a comparator that compares the amplitude value of the output pulse of the filter processing circuit with a reference value, and detects a position of a pulse with which the result of the comparison by the comparator changes.

4. The filter circuit according to claim 3 , wherein the impedance element selection unit generates a comparison pulse signal that is produced by rendering the amplitude value of the inputted variable frequency pulse signal the reference value and the comparator compares the amplitude value of the output pulse of the filter processing circuit with the amplitude value of the comparison pulse signal.

5. The filter circuit according to claim 1 , wherein the impedance element selection unit changes the selection state of the plurality of impedance elements so as to change the cutoff frequency to the desired frequency on the basis of the detected pulse position.

6. The filter circuit according to claim 1 , wherein the impedance element selection unit establishes a state where a predetermined impedance element is selected as the initial state and changes the selection state of the impedance element on the basis of a pulse, that is attenuated to or below the reference value, of the output pulse outputted in the initial state.

7. The filter circuit according to claim 1 , wherein the filter processing circuit is a low pass filter that transmits a signal with a lower frequency range than the cutoff frequency and attenuates a signal with a higher frequency range than the cutoff frequency, or is a high pass filter that transmits a signal with a higher frequency range than the cutoff frequency and attenuates a signal with a lower frequency range than the cutoff frequency.

8. The filter circuit according to claim 1 , wherein the variable frequency pulse comprises a plurality of pulse groups with a successively changing frequency and the pulse groups include a plurality of pulses with the same frequency.

9. A method of measuring a cutoff frequency of a filter circuit, the cutoff frequency being dependent on an internal impedance element, the method comprising the steps of:

supplying a variable frequency pulse with a successively increasing or decreasing frequency to an input of the filter circuit; and

checking an attenuation of an output pulse of the filter circuit that corresponds with the input of the variable frequency pulse and detecting the cutoff frequency on the basis of the position of a pulse that is attenuated to or below a reference value.

10. The method of measuring the cutoff frequency of a filter circuit according to claim 9 , wherein the filter circuit comprises a plurality of selectable impedance elements and the cutoff frequency is dependent on the selected impedance element, the method further comprising the step of:

selecting the plurality of impedance elements in accordance with the detected cutoff frequency.

11. A filter circuit, having a plurality of selectable impedance elements, that has a cutoff frequency dependent on a selected impedance element, comprising:

a filter circuit that transmits a signal with a frequency range based on the cutoff frequency;

a pulse generation circuit that supplies a variable frequency signal with a successively increasing or decreasing frequency to an input of the filter circuit; and

an impedance element selection unit that checks an attenuation of an output signal of the filter circuit corresponding with the input of the variable frequency signal and selects the plurality of impedance elements on the basis of a position of the output signal that is attenuated to or below a reference value.

12. The filter circuit according to claim 11 , wherein the variable frequency signal is a sine wave with a successively changing frequency or a pulse signal with a successively changing frequency.

Assignments (9)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040911/0238 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 11, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 039708/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036037/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2005
From: MIZUMASA, TATSUHIRO; NOZOE, KOJI
To: FUJITSU LIMITED
Reel/Frame 016225/0874 →