IP Library Granted Patent US 7,948,069
Granted Patent B2
US 7,948,069 · App. 11/044,933 · Granted May 24, 2011

Surface mountable hermetically sealed package

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Quick Facts
Patent No.
US 7,948,069
App. No.
11/044,933
Granted
May 24, 2011
Kind
B2
Abstract

A high reliability package which includes electrical terminals formed from an alloy of tungsten copper and brazed onto a surface of a ceramic substrate.

Claims (25)

1. A semiconductor package comprising:

a flat substrate, said substrate including a first major surface and a second major surface opposite said first major surface, and an opening therethrough;

a first electrical terminal on said first major surface of said substrate;

a second electrical terminal attached to said second major surface of said substrate and being wider than said opening such that said second electrical terminal closes said opening;

a semiconductor die disposed in said opening and having a first electrode electrically connected to said first electrical terminal and a second electrode disposed opposite said first electrode and electrically and mechanically connected to said second electrical terminal by a layer of conductive adhesive;

a hermetically sealed cover attached to said first major surface and closing said opening;

wherein said first electrical terminal and said second electrical terminal each have a surface for external electrical connection outside said package;

wherein said second electrical terminal being wider than said opening enables said package to pass a current of approximately 200 A and withstand a voltage between said electrical terminals of approximately 2 kV.

2. A semiconductor package according to claim 1 , wherein said substrate is comprised of a ceramic material.

3. A semiconductor package according to claim 1 , wherein said substrate is comprised of alumina.

4. A semiconductor package according to claim 1 , wherein said terminals are comprised of a copper tungsten alloy.

5. A semiconductor package according to claim 4 , wherein said alloy substantially consists of 80% tungsten and 20% copper by weight.

6. A semiconductor package according to claim 4 , wherein said alloy substantially consists of 85% tungsten by weight and 15% copper by weight.

7. A semiconductor package according to claim 1 , wherein said hermetically sealed cover includes a ceramic enclosure disposed around said semiconductor die and hermetically attached to said substrate, and a lid hermetically attached to said ceramic enclosure.

8. A semiconductor package according to claim 7 , further comprising a hermetic seal disposed between said lid and said ceramic enclosure.

9. A semiconductor package according to claim 8 , wherein said hermetic seal is comprised of 80% gold and 20% tin by weight.

10. A semiconductor package according to claim 7 , wherein said lid is comprised of either Kovar or Alloy 42.

11. A semiconductor package according to claim 1 , wherein said first electrical terminal on said first major surface of said substrate is electrically and mechanically connected to said first electrode by a layer of conductive adhesive.

12. A semiconductor package according to claim 11 , wherein said conductive adhesive is solder.

13. A semiconductor package according to claim 12 , wherein said solder is lead based.

14. A semiconductor package according to claim 1 , wherein said semiconductor die is a power switching device.

15. A semiconductor package according to claim 14 , wherein said power switching device is either a power MOSFET or an IGBT.

16. A semiconductor package according to claim 14 , further comprising at least one diode electrically and mechanically connected to said second electrical terminal.

17. A semiconductor package according to claim 1 , further comprising a third electrical terminal adjacent said first electrical terminal.

18. A semiconductor package according to claim 17 , wherein said first and said third electrical terminals are disposed along one edge of said substrate and further comprising a fourth and a fifth electrical terminal disposed along another opposing edge of said substrate.

Assignments (1)
CHANGE OF NAME Recorded Jul 23, 2018
From: INTERNATIONAL RECTIFIER CORPORATION
To: INFINEON TECHNOLOGIES AMERICAS CORP.
Reel/Frame 046612/0968 →