Voltage testing and measurement
View Patent ↗An improved voltage test system.
1. A method of testing a device under test comprising:
(a) providing a coherent beam of light from a light source having a first wavelength;
(b) imposing said coherent beam of light on a test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a first state;
(c) imposing said beam of light on said test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a second state;
(d) obtaining data resulting from the interference of said first beam and said second beam within said device under test representative of the voltages within said region;
(e) wherein said first state is at a first voltage potential, and wherein said second state is at a second voltage potential different from said first voltage potential.
2. The method of claim 1 wherein said beam is provided from a laser.
3. The method of claim 2 wherein said test device is silicon.
4. The method of claim 1 wherein said coherent light is infrared.
5. The method of claim 1 wherein said interference of said first beam and said second beam is within said test device.
6. The method of claim 1 wherein said interference of said first beam and said second beam is calculated.
7. The method of claim 1 wherein said first state of refraction is without a voltage being applied thereto.