IP Library Granted Patent US 7,378,635
Granted Patent B2
US 7,378,635 · App. 11/055,105 · Granted May 27, 2008

Method and apparatus for dark current and hot pixel reduction in active pixel image sensors

Assignee: Micron Technology, Inc.
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Quick Facts
Patent No.
US 7,378,635
App. No.
11/055,105
Granted
May 27, 2008
Kind
B2
Abstract

A method of operating an imager pixel that includes the act of applying a relatively small voltage on the gate of a transfer transistor during a charge acquisition period. If a small positive voltage is applied, a depletion region is created under the transfer transistor gate, which creates a path for dark current electrons to be transferred to a pixel floating diffusion region. The dark electrons are subsequently removed by a pixel reset operation. If a small negative voltage is applied to the transfer gate, electrons that would normally create dark current problems will instead recombine with holes thereby substantially reducing dark current.

Claims (71)

1. A method of operating an imager pixel circuit comprising a photosensor, a transfer gate and a floating diffusion region, said method comprising the acts of:

initiating a charge acquisition period for the photosensor;

determining a gain setting associated with the pixel circuit;

applying a substantially zero voltage level to the transfer gate during the acquisition period under a first gain condition; and

applying a non-zero voltage level to the transfer gate during the acquisition period under a second gain condition which represents a higher gain than said first gain condition,

wherein the level of the applied non-zero voltage is one of a plurality of non-zero voltages that is associated with a respective one of a plurality of gain settings.

2. The method of claim 1 , wherein the non-zero voltage level is a positive voltage level.

3. The method of claim 1 , further comprising the act of resetting the floating diffusion region after the acquisition period.

4. The method of claim 1 , wherein the non-zero voltage level is applied during an entirety of the acquisition period.

5. The method of claim 1 , wherein the voltage level is a negative voltage.

6. A method of operating an imager pixel circuit comprising a photosensor, a transfer gate and a floating diffusion region, said method comprising the acts of:

initiating a charge acquisition period for the photosensor;

determining a gain of the imager;

and

applying a positive voltage to the transfer gate during the acquisition periods which serves as a path for dark current electrons to flow to the floating diffusion region,

wherein a level of the applied voltage is dependant upon a determined gain and is:

a substantially zero voltage level if said determined gain is a first gain level, one of a range plurality of non-zero voltage levels that is associated with a respective one of a plurality of gain settings if said determined gain is a second gain level, said second gain level being different from first gain level.

7. The method of claim 6 , further comprising the act of resetting the floating diffusion region after the acquisition period.

8. The method of claim 6 , wherein the voltage level is applied during an entirety of the acquisition period.

9. A method of operating an imager pixel circuit comprising a photosensor, a transfer gate and a floating diffusion region, said method comprising the acts of:

initiating a charge acquisition period for the photosensor;

determining a gain setting associated with the pixel circuit;

and combining dark electrons underneath the transfer gate with electron holes to substantially reduce a number of dark current electrons,

wherein the combining act comprises:

applying a substantially zero voltage to the transfer gate during the acquisition period under a first gain setting,

applying a negative voltage to the transfer gate during the acquisition period under a second gain setting, wherein a level of the applied voltage is one of a plurality of non-zero voltage levels that is associated with a respective one of a plurality of gain settings.

10. The method of claim 9 , wherein the voltage is applied during an entirety of the acquisition period.

11. An imager comprising:

an array of pixels, each pixel comprising a photosensor, a transfer gate and a floating diffusion region; and

a control circuit electrically connected to said array, said control circuit configured to operate each pixel in a selected row by:

initiating a charge acquisition period for the photosensor, and

applying a voltage to the transfer gate of each pixel in the selected row during the acquisition period,

wherein said applied voltage is based on a gain setting of the imager,

wherein a level of the applied voltage is a substantially zero voltage level if said gain setting is a first gain setting,

wherein a level of the applied voltage is one of a plurality of non-zero voltage levels that is associated with a respective one of a plurality of gain settings if said gain setting is a second gain setting different from said first gain setting.

12. The imager of claim 11 , wherein the voltage is a positive voltage.

13. The imager of claim 12 , wherein the positive voltage is greater than approximately 0.0 volts, but no more than approximately 0.8 volts.

14. The imager of claim 11 , wherein said control circuit further controls the pixel by resetting the floating diffusion region after the acquisition period.

15. The imager of claim 11 , wherein the voltage is a negative voltage.

16. The imager of claim 15 , wherein the negative voltage is less than approximately 0.0 volts, but not less than approximately −0.8 volts.

17. The imager of claim 11 , wherein the non-zero voltage is applied during an entirety of the acquisition period.

18. A processor system comprising:

a processor; and

an imager coupled to said processor, said imager comprising:

an array of pixels, each pixel comprising a photosensor, a transfer gate, and a floating diffusion region; and

a control circuit electrically connected to said array,

said control circuit configured to determine a gain setting associated with each pixel, said control circuit configured to operate each pixel in a selected row by initiating a charge acquisition period for the photosensor and applying a voltage to the transfer gate of the pixel in the selected row during the acquisition period,

wherein the applied voltage is:

substantially zero under a first gain condition,

one of a plurality of non-zero voltage levels associated with a respective one of a plurality of gain settings under a second gain condition which represents a higher gain than said first gain condition.

19. The system of claim 18 , wherein the voltage is a positive voltage.

20. The system of claim 19 , wherein the voltage is greater than approximately 0.0 volts, but no more than approximately 0.8 volts.

21. The system of claim 19 , wherein said control circuit is further configured to control the pixel by resetting the floating diffusion region after the acquisition period.

22. The system of claim 18 , wherein the voltage is a negative voltage.

23. The system of claim 22 , wherein the negative voltage is less than approximately 0.0 volts, but not less than approximately −0.8 volts.

24. A method of operating an imager pixel circuit comprising a photosensor, a transfer gate and a floating diffusion region, said method comprising the acts of:

initiating a charge acquisition period for the photosensor;

determining a light intensity associated with the pixel circuit;

applying a substantially zero voltage level to the transfer gate during the acquisition period under a first light intensity; and

applying one of a plurality of non-zero voltage levels to the transfer gate during the acquisition period in accordance with a determined level of light intensity under a second light intensity which represents a higher light intensity than said first light intensity.

25. The method of claim 24 , wherein the voltage is a positive voltage.

26. The method of claim 24 , wherein the voltage is a negative voltage.

27. An imager comprising:

an array of pixels, each pixel comprising a photosensor, a transfer gate, and a floating diffusion region; and

a control circuit electrically connected to said array,

said control circuit configured to determine a light intensity associated with the pixel, said control circuit configured to operate each pixel in a selected row by initiating a charge acquisition period for the photosensor and applying a voltage to the transfer gate of each pixel in the selected row during the acquisition period,

wherein said applied voltage is:

a substantially zero voltage level to the transfer gate during the acquisition period under a first light intensity,

one of a plurality of non-zero voltage levels which corresponds to the detected light intensity on the imager under a second light intensity which represents a higher light intensity than said first light intensity.

28. The imager of claim 27 , wherein the voltage is a positive voltage.

29. The imager of claim 27 , wherein the voltage is a negative voltage.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2009
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 023245/0186 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2005
From: AGRANOV, GENNADIY; LI, XIANGLI; ALTICE, JR. PETER P.; MAVRITZSON, RICK
To: MICRON TECHNOLOGY, INC.
Reel/Frame 016276/0497 →
Continuity (1)
Related Publication 20060180741A1 · Aug 17, 2006