IP Library Granted Patent US 7,201,071
Granted Patent B2
US 7,201,071 · App. 11/056,716 · Granted Apr 10, 2007

Wide range continuous diluter

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Quick Facts
Patent No.
US 7,201,071
App. No.
11/056,716
Granted
Apr 10, 2007
Kind
B2
Abstract

A wide range continuous diluter for diluting gases that contain small particles to allow subsequent measurement of the diluted gases with an instrument is provided. A dilution gas inlet receives a dilution gas, and a sample gas inlet receives a sample gas. A flow meter measures the sample gas flow rate. A mixer receives and mixes the dilution gas and the sample gas at a dilution ratio. An instrument flow outlet provides a well-defined flow into the instrument from the mixture flow. A make-up gas inlet is arranged to provide make-up gas into the mixture flow at a controlled rate. Because the dilution gas flows at a controlled rate and the mixture flows at a controlled rate, changing the flow rate of the make-up gas causes a responsive change in the sample gas flow rate, thereby allowing continuous adjustment and control of the dilution ratio when desired.

Claims (30)

1. A wide range continuous diluter for diluting gases that contain small particles to allow subsequent measurement of the diluted gases with an instrument, the diluter comprising:

a dilution gas inlet for receiving a dilution gas at a controlled rate;

a sample gas inlet for receiving a sample gas;

a flow meter for measuring the sample gas flow rate;

a mixer connected to the dilution gas inlet and to the sample gas inlet for receiving and mixing the dilution gas and the sample gas at a dilution ratio, the mixer having an outlet for providing a mixture flow at a controlled rate;

an instrument flow outlet arranged to provide a well-defined flow into the instrument from the mixture flow;

a make-up gas inlet arranged to provide make-up gas into the mixture flow at a controlled rate; and

whereby changing the flow rate of the make-up gas causes a responsive change in the sample gas flow rate, thereby allowing continuous adjustment of the dilution ratio.

2. The diluter of claim 1 wherein the mixture flow rate is controlled by a critical flow orifice.

3. The diluter of claim 1 wherein the mixture flow rate is controlled by a mass flow controller.

4. The diluter of claim 1 wherein the dilution gas flow rate is controlled by a mass flow controller.

5. The diluter of claim 1 wherein the flow meter for measuring the sample gas flow rate comprises an orifice flow meter.

6. The diluter of claim 1 wherein the flow meter for measuring the sample gas flow rate comprises a plurality of differently sized orifice flow meters, and wherein the orifice flow meter applied to the sample gas flow depends on the dilution ratio.

7. The diluter of claim 1 further comprising:

a feedback control loop for controlling the dilution ratio by varying the make-up gas flow such that the dilution ratio tracks a desired value.

8. The diluter of claim 7 wherein the feedback control loop utilizes proportional/integral/derivative control.

9. The diluter of claim 7 wherein the feedback control loop is configured to track a constant dilution ratio.

10. The diluter of claim 1 wherein the flow into the instrument is a constant instrument flow.

11. The diluter of claim 1 wherein the flow into the instrument is a well-defined variable instrument flow.

12. The diluter of claim 1 further comprising:

a by-pass flow outlet upstream of the flow meter to reduce the residence time of the sample gas flow in a transfer line connecting the sample gas inlet to the sampling source.

13. The diluter of claim 1 further comprising:

a filter located upstream of the make-up gas inlet.

14. A method of using the wide range continuous diluter of claim 1 , the method comprising:

controlling the make-up gas flow rate to cause an outward flow from the sample gas inlet; and

obtaining the measurement from the instrument.

15. A method of using the wide range continuous diluter of claim 1 , the method comprising:

adjusting the make-up gas flow rate to cause a responsive change in the sample gas flow rate.

16. The method of claim 15 wherein the make-up gas flow rate is adjusted such that the dilution rate tracks a desired value.

17. The method of claim 16 wherein the desired value is a constant dilution rate.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2007
From: HORIBA INSTRUMENTS, INC.
To: HORIBA, LTD.
Reel/Frame 019754/0117 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2005
From: ASANO, ICHIRO
To: HORIBA, LTD.
Reel/Frame 017157/0446 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2005
From: WEI, QIANG
To: HORIBA INSTRUMENTS
Reel/Frame 016279/0250 →