Sample machining device and sample analysis device
View Patent ↗The invention relates to a sample machining device, in particular for preparing samples for OES and/or XRF and/or combustion analyses, having at least one sample holder, and to provide a development which is advantageous in use proposes that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and that at least one additional tool, in particular a drilling or separate milling tool, is provided in order to produce chips from the remainder piece of the sample. Moreover, the invention relates to a sample analysis device in which, according to the invention, the abovementioned sample machining device and means for carrying out OES analysis and/or XRF analysis and/or combustion analysis are provided.
1. Sample machining device having at least one sample holder, characterized in that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and in that at least one additional tool is provided in order to produce chips from the remainder piece of the sample.
2. Sample machining device according to claim 1 , characterized in that the sample holder can be displaced in the lateral and/or vertical direction at least between machining positions of the cylindrical milling cutter and of the additional tool.
3. Sample machining device according to claim 1 , characterized in that the cylindrical milling cutter is disposed on a first spindle and the additional tool is disposed on a second spindle.
4. Sample machining device according to claim 1 , characterized in that the sample holder is adapted to holding rotationally symmetrical samples, so that a sample center line extends at least substantially parallel to the rotation center line of the cylindrical milling cutter.
5. Sample machining device according to claim 1 , characterized in that the sample holder is adapted to holding conical samples, so that a wider foot end of the sample is received in the sample holder and a narrowing sample section protrudes from the sample holder.
6. Sample machining device according to claim 1 , characterized in that the sample machining device is adapted to receiving conical samples, a larger end diameter of which is in the range from 36 to 45 millimeters and/or a smaller end diameter of which is in the range from 28 to 36 millimeters and/or the height of which is in the range from 45 to 65 millimeters.
7. Sample machining device according to claim 1 , characterized in that control means are provided for the automatic centering of the additional tool with respect to a clamping region of the sample holder.
8. Sample machining device according to claim 1 , characterized in that a control means are adapted for automatic alignment of the additional tool to the remainder piece in order to form chips from a central region, in particular from the center of a surface thereof formed by the cylindrical milling cutter.
9. Sample machining device according to claim 1 , characterized in that the at least one additional tool is adapted for removal of chips from a surface of the remainder piece.
10. Sample machining device according to claim 1 , characterized in that a purge device for supplying inert gas into at least one milling and/or drilling region of the sample machining device is provided.
11. Sample analysis device according to claim 10 , characterized in that the inert gas comprises at least one of argon, helium and nitrogen.
12. Sample machining device according to claim 1 , characterized in that an extraction device for sucking out chips that are to be produced by means of the additional tool is provided.
13. Sample machining device according to claim 12 , characterized in that the extraction device has at least one transport fan which sucks the inert gas out of at least one milling and/or drilling region as carrier gas for the chips.
14. Sample analysis device, characterized in that at least one sample machining device according to claim 1 is provided, and in that means for carrying out OES analysis and/or XRF analysis and/or combustion analysis are provided.
15. Sample analysis device according to claim 14 , characterized in that conveying means are provided for transporting the free piece of the sample from the sample machining device to means for carrying out OES analysis and/or XRF analysis.
16. Sample analysis device according to claim 15 , characterized in that a number of thermal analyzers are provided, adapted for detecting carbon, sulfur, nitrogen and oxygen.
17. Sample analysis device according to claim 16 , characterized in that means for pneumatically transporting chips from the sample machining device to the thermal analyzers are provided.
18. Sample analysis device according to claim 17 , characterized in that the extraction device is adapted for transporting chips and inert gas as carrier gas from the sample machining device to the thermal analyzers.
19. Sample analysis device according to claim 1 , characterized in that the at least one additional tool comprises a drilling or separate milling tool.