Method for fabricating semiconductor device
View Patent ↗In a method for fabricating a semiconductor device, interconnect grooves are formed in an insulating film on a substrate, and then a copper film is formed on the insulating film to fill the interconnect grooves. Subsequently, portions of the copper film existing outside the interconnect grooves are polished to form interconnects, and then a cleaning process is performed on the resulting substrate. Thereafter, moisture remaining around a portion of the insulating film exposed between the interconnects is removed in a vacuum.
1. A method for fabricating a semiconductor device, comprising the steps of:
(a) forming interconnect grooves in an insulating film on a substrate;
(b) forming a copper film on the insulating film to fill the interconnect grooves;
(c) polishing portions of the copper film existing outside the interconnect grooves to form interconnects;
(d) performing a cleaning process on the substrate having been formed with the interconnects;
(e) removing, after the cleaning process, moisture remaining around a portion of the insulating film exposed between the interconnects; and
(f) coating an anticorrosive onto the surfaces of the interconnects after step (e),
wherein step (e) includes a substep of desorbing, in a vacuum, water molecules adsorbed on the insulating film, and
the anticorrosive is not exposed to step (e).
2. The method of claim 1 , further comprising, after step (f), the step of removing, in a vacuum, moisture remaining around a portion of the insulating film exposed between the interconnects.
3. The method of claim 1 , wherein steps (c), (d), (e) including the substep, and (f) are carried out within a single semiconductor fabrication apparatus.
4. The method of claim 1 , wherein step (e) further includes a substep of performing, after the cleaning process, spin drying on the substrate.
5. A method for fabricating a semiconductor device, comprising the steps of:
(a) forming interconnect grooves in an insulating film on a substrate;
(b) forming a copper film on the insulating film to fill the interconnect grooves;
(c) polishing portions of the copper film existing outside the interconnect grooves to form interconnects;
(d) performing a cleaning process on the substrate having been formed with the interconnects;
(e) removing, after the cleaning process, moisture remaining around a portion of the insulating film exposed between the interconnects; and
(f) coating an anticorrosive onto the surfaces of the interconnects after step (e),
wherein step (e) further includes a substep of performing, after the cleaning process, spin drying on the substrate, and after performing the spin drying, a substep of desorbing, in a vacuum, water molecules adsorbed on the insulating film.
6. The method of claim 1 , further comprising the step of measuring a moisture concentration and terminating step (e) when the moisture concentration is equal to or lower than a predetermined concentration.
7. The method of claim 5 , further comprising the step of measuring a moisture concentration and terminating step (e) when the moisture concentration is equal to or lower than a predetermined concentration.