Method and system for mass analysis of samples
View Patent ↗A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.
1. A method of analyzing a sample, the method comprising:
producing a source beam of analyte ions from the sample;
by the steps of deflecting and pulsing, generating from the source beam at least a first beam of first select packets of analyte ions and a second beam of second select packets of analyte ions, the step of deflecting to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths, and the step of pulsing to generate the packets of analyte ions from either the source beam or the at least first and second beams, the steps of deflecting and pulsing to generate the at least first and second select packet of analyte ions different from each other and offset from each other in both time and space;
detecting the select packets of analyte ions of the at least first and second beams in respective at least first and second detection regions; and
performing a mass analysis of the sample based on the detected select packets of analyte ions.
2. The method of claim 1 , wherein the source beam is pulsed to generate the packets of analyte ions before the source beam is deflected.
3. The method of claim 1 , wherein the at least the first and the second beams are pulsed after the source beam is deflected.
4. The method of claim 2 , wherein the source beam is pulsed to generate packets of analyte ions at an initial frequency, and the source beam is deflected, as a function of time, to generate the at least first and second beams having respective at least first and second select packets of analyte ions at respective at least first and second frequencies, and the combined at least first and second frequencies not greater than the initial frequency.
5. The method of claim 1 , wherein in the step of deflecting at least one of the first and second beams is undeflected.
6. The method of claim 1 , wherein in the step of deflecting all of the at least first and second beams are deflected.
7. A system for analyzing a sample, the system comprising:
an ion source derived from the sample for producing a source beam of analyte ions;
a deflector to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths;
a pulse generator to generate packets of analyte ions from either the source beam or the at least first and second beams, the deflector and pulse generator to generate packets of analyte ions different from each other and offset from each other in both time and space;
at least a first and second detection region to detect select packets of analyte ions from the respective at least first and second beams; and
an analyzer to perform a mass analysis of the sample based on the detected select packets of analyte ions.
8. The system of claim 7 , wherein the source beam is pulsed to generate the packets of analyte ions before the source beam is deflected.
9. The system of claim 7 , wherein the at least the first and the second beams are pulsed after the source beam is deflected.
10. The system of claim 8 , wherein the source beam is pulsed to generate packets of analyte ions at an initial frequency, and the source beam is deflected, as a function of time, to generate the at least first and second beams having respective at least first and second select packets of analyte Ions at respective at least first and second frequencies, and the combined at least first and second frequencies not greater than the initial frequency.
11. The system of claim 7 , wherein the deflector is adapted to leave at least one of the first and second beams undeflected.
12. The system of claim 7 , wherein the deflector is adapted to deflect all of the at least first and second beams.
13. A method of analyzing a sample with a time-of-flight mass analyzer, the method comprising:
producing a source beam of analyte ions from the sample;
by the steps of deflecting and pulsing, generating from the source beam at least a first beam of first select packets of analyte ions and a second beam of second select packets of analyte ions, the step of deflecting to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths, and the step of pulsing to generate the packets of analyte ions from either the source beam or the at least first and second beams, the steps of deflecting and pulsing to generate the at least first and second select packet of analyte ions different from each other and offset from each other in both time and space;
detecting the select packets of analyte ions of the at least first and second beams in respective at least first and second detection regions; and
performing a mass analysis of the sample using a time of flight analyzer based on the detected select packets of analyte icons.
14. A system for analyzing a sample with a time-of-flight mass spectrometer, the system comprising:
an ion source derived from the sample for producing a source beam of analyte ions;
a deflector to deflect the source beam with an electric field so that the at least first and second beams are offset from each other to propagate along different paths;
a pulse generator to generate packets of analyte ions from either the source beam or the at least first and second beams, the deflector and pulse generator to generate the at least first and second select packets of analyte ions different from each other and offset from each other in both time and space;
at least a first and second detection region to detect select packets of analyte ions from the respective at least first and second beams; and
a time of flight analyzer for analyzing the sample based on the detected select packets of analyte ions.
15. The method of claim 1 , wherein producing a source beam of analyte ions from the sample includes using an ion source selected from an electrospray ionization source, an atmospheric pressure chemical ionization source or an atmospheric pressure photoionization source.
16. The method of claim 1 , further comprising embedding the analyte in a matrix to produce the sample for analyzing.
17. The method of claim 16 , wherein the step of producing a source beam of analyte ions includes using matrix assisted laser desorption/ionization with collisional cooling (orthogonal MALDI).
18. The method of claim 2 , wherein the step of generating packets of analyte ions includes, before the step of deflecting,
producing analyte ions from the sample;
collimating the analyte ions to produce the source beam; and
pulsing the source beam with electric field pulses to generate a sequence of packets of analyte ions.
19. The method of claim 3 , wherein the step of producing the source beam of analyte ions includes, before the step of deflecting,
producing analyte ions from the sample; and
collimating the analyte ions to produce the source beam of analyte ions.
20. The method of claim 19 , further comprising after the step of deflecting, pulsing the at least first and second beams with electric field pulses.
21. The method of claim 1 , wherein the step of performing a mass analysis includes creating a mass spectrum of the sample.
22. The system of claim 7 , further comprising an ion source selected from an electrospray ionization source, an atmospheric pressure chemical ionization source or an atmospheric pressure photoionization source for producing the source beam of analyte ions.
23. The system of claim 7 , further comprising a matrix for preparing the sample.
24. The system of claim 23 , further comprising matrix assisted laser desorption/ionization with collisional cooling (orthogonal MALDI) apparatus for producing the source beam of analyte ions.
25. The system of claim 8 , further comprising an ion beam preparation apparatus for collimating analyte ions from the ion source to produce the source beam of analyte ions, and the pulse generator for pulsing the source beam with electric field pulses, before the deflection by the deflector, to generate a sequence of packets of analyte ions.
26. The system of claim 9 , further comprising an ion beam preparation system having a mass filter for filtering analyte ions from the ion source and collision cell to fragment the analyte ions to produce the source beam.
27. The system of claim 26 , wherein the pulse generator for pulsing the at least first and second beams with electric field pulses after the deflection by the deflector.
28. The system of claim 7 , wherein the mass analyzer is capable of creating a mass spectrum of the sample.
29. A method of analyzing a sample according to claim 13 further comprising orthogonally pulsing the source beam of analyte ions before deflecting the beam.
30. A method of analyzing a sample according to claim 13 further comprising after deflecting the source beam, orthogonally pulsing the at least first and second beams.
31. A system for analyzing a sample according to claim 14 further comprising an accelerator for pulsing the beam.