Ion source and methods for MALDI mass spectrometry
View Patent ↗Provided are MALDI ion sources, methods of forming ions and mass analyzer systems. In various embodiments, provided are MALDI ion sources configured to irradiate a sample on a sample surface with a pulse of laser energy at angle within 10 degrees or less of the surface normal, and a first ion optics system configured to extract sample ions in a direction within 5 degrees or less of the surface normal. In various embodiments, MALDI ion sources having substantially coaxial sample irradiation and ion extraction are provided. In various embodiments, methods are provided, which produce sample ions by MALDI and extract sample ions using an accelerating electrical field to form an ion beam, such that, the angle of the trajectory at the exit from the accelerating electrical field of sample ions substantially at the center of the ion beam is substantially independent of sample ion mass.
1. An ion source for matrix-assisted laser desorption/ionization comprising:
a sample holder having a sample surface;
an optical system configured to irradiate a sample on the sample surface with a pulse of energy such that the pulse of energy strikes a sample on the sample surface; and
a first ion optics system configured to extract sample ions in a first direction substantially normal to the sample surface; wherein the pulse of energy striking the sample is substantially coaxial with the first direction.
2. The ion source of claim 1 , wherein the first ion optics system comprises:
a first electrode disposed between the sample holder and a second electrode, the first electrode having an aperture and the second electrode having an aperture; and
a first ion optical axis defined by the line between the center of the aperture in the first electrode and the center of the aperture in the second electrode, the first ion optical axis intersecting the sample surface at an angle within 5 degrees of the normal of the sample surface.
3. The ion source of claim 2 , wherein the first ion optical axis intersects the sample surface at an angle within 1 degree of the normal of the sample surface.
4. The ion source of claim 2 , wherein the first ion optics system further comprises an ion deflector disposed between the first electrode and the second electrode, the ion deflector configured to deflect sample ions in a second direction.
5. The ion source of claim 4 , wherein the ion source further comprises a third electrode displaced from the ion deflector in a direction opposite the second electrode, the third electrode positioned to receive sample ions traveling along the second direction.
6. The ion source of claim 5 , wherein the third electrode is also positioned such that neutral molecules traveling from the sample holder in the first direction do not substantially collide with the third electrode.
7. The ion source of claim 1 , further comprising a second ion optics system displaced from the first ion optics system in a direction opposite the sample holder, the second ion optics system configured to deflect sample ions in a second direction.
8. The ion source of claim 7 , wherein the second ion optics system comprises a first ion deflector.
9. The ion source of claim 7 , wherein the second ion optics system further comprises a third electrode displaced from the first ion deflector in a direction opposite the first ion optics system.
10. The ion source of claim 7 , further comprising a third ion optics system displaced from the second ion optics system in a direction opposite the first ion optics system, the third ion optics system configured to receive sample ions traveling along the second direction and to deflect the sample ions in a third direction.
11. The ion source of claim 10 , wherein the third ion optics system comprises a fourth electrode having an aperture, the fourth electrode positioned such that neutral molecules traveling from the sample holder in the first direction do not substantially collide with the fourth electrode.
12. The ion source of claim 11 , wherein the third ion optics system further comprises a second ion deflector positioned such that neutral molecules traveling from the sample holder in the first direction do not substantially collide with the second ion deflector.
13. An ion source for matrix-assisted laser desorption/ionization comprising:
a sample holder having a sample surface;
a first electrode disposed between the sample holder and a second electrode, the first electrode having an aperture and the second electrode having an aperture;
an extraction direction defined by the line between the center of the aperture in the first electrode and the center of the aperture in the second electrode; and
an optical system configured to irradiate a sample on the sample surface with a pulse of energy having a Poynting vector, the optical system configured such that the Poynting vector is substantially coaxial with the extraction direction.
14. The ion source of claim 13 , wherein the Poynting vector intersects the sample surface at an angle in the range between about 5 degrees and 50 degrees with respect to the normal of the sample surface.