IP Library Granted Patent US 7,042,028
Granted Patent B1
US 7,042,028 · App. 11/079,994 · Granted May 9, 2006

Electrostatic discharge device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,042,028
App. No.
11/079,994
Granted
May 9, 2006
Kind
B1
Abstract

An electrostatic discharge (ESD) device, which functions like a diode during normal IC operation and like a SCR during an electrostatic discharge event, is provided. To form an equivalent SCR structure, the ESD device includes a plurality of N+ regions and a plurality of P+ regions formed inside an N-well. The P+ regions and the N+ regions are formed adjacent to each other in a sequence, and the regions located at both ends of the sequence are the N+ regions. In addition, the ESD device is integrated with a pad and is formed under the pad. Furthermore, since the pad has a large surface area and is plated to be a good electrical conductor, the current distribution in the ESD device is uniform.

Claims (31)

1. An electrostatic discharge device, comprising:

a P-substrate;

an N-well, formed in said P-substrate;

a first N+ region, formed adjacent to said N-well, said first N+ region being isolated from said N-well;

a first P+ region, formed adjacent to said N-well, said first P+ region being isolated from said N-well and said first N+ region;

a plurality of second P+ regions formed inside said N-well;

a plurality of second N+ regions formed inside said N-well, two of said second N+ regions being located adjacent to boundaries of said N-well;

a first electrode, connecting to at least one of said second N+ regions and at least one of said second P+ region located adjacent to said second N+ region via a first electrical conductor, wherein said first electrical conductor is made of a metal; and

a second electrode, connecting to at least one of said first P+ regions and at least one of said first N+ regions via a second electrical conductor, wherein said second electrical conductor is made of said metal.

2. The electrostatic discharge device as claimed in claim 1 , wherein a width of said N-well can be modulated relatively to said two of said second N+ regions located adjacent to boundaries of said N-well, wherein shortening said width of said N-well reduces a breakdown voltage of a parasitic SCR structure of said electrostatic discharge device, and extending said width of said N-well increases said breakdown voltage of said parasitic SCR structure of said electrostatic discharge device.

3. The electrostatic discharge device as claimed in claim 1 , wherein said second P+ regions and said second N+ regions are formed adjacent to each other and arranged in an interleaved manner.

4. The electrostatic discharge device as claimed in claim 2 , said electrostatic discharge device being formed under a pad.

5. The electrostatic discharge device as claimed in claim 3 , said electrostatic discharge device being formed under a pad.

6. The electrostatic discharge device as claimed in claim 4 , wherein said pad is connected to one of said first and second electrodes, while the other electrode unconnected to said pad is connected to a voltage level via an electrical conductor.

7. The electrostatic discharge device as claimed in claim 5 , wherein said pad is connected to one of said first and second electrodes, while the other electrode unconnected to said pad is supplied with a voltage level via an electrical conductor.

8. An electrostatic discharge device, comprising:

a P-substrate;

an N-buried layer, formed in said P-substrate;

an N-well, formed on said N-buried layer;

a P-well, formed on said N-buried layer adjacent to said N-well;

a third N+ region, formed inside said N-well, said third N+ region being isolated from said P-well and said third N+ region;

a third P+ region, formed inside said N-well, said third P+ region being isolated from said P-well and said third N+ region;

a plurality of fourth N+ regions, formed inside said P-well;

a plurality of fourth P+ regions, formed inside said P-well, two of said fourth P+ regions being located adjacent to both boundaries of said P-well;

a first electrode, connecting to at least one of said fourth N+ regions and at least one of said fourth P+ region via a first electrical conductor; and

a second electrode, connecting to at least one of said third P+ region and at least one of said third N+ region via a second electrical conductor.

9. The electrostatic discharge device as claimed in claim 8 , wherein said fourth P+ regions and said fourth N+ regions are formed adjacent to each other and arranged in an interleaved manner.

10. The electrostatic discharge device as claimed in claim 9 , said electrostatic discharge device being formed under a pad.

11. The electrostatic discharge device as claimed in claim 10 , wherein said pad is connected to one of said first and second electrodes, while the other electrode unconnected to said pad is supplied with a voltage level via an electrical conductor.

12. The electrostatic discharge device as claimed in claim 8 , wherein said P-well is geometrically constituted by a part of said P-substrate, which is not occupied by said N-well and said N-buried layer.

13. The electrostatic discharge device as claimed in claim 8 , wherein said P-well is formed with P-type ions doping.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RECORDED AT REEL 046410, FRAME 0933 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064072/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 22, 2018
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 046410/0933 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2017
From: FAIRCHILD (TAIWAN) CORPORATION (FORMERLY SYSTEM GENERAL CORPORATION)
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 042328/0318 →
CHANGE OF NAME Recorded Jun 8, 2016
From: SYSTEM GENERAL CORP.
To: FAIRCHILD (TAIWAN) CORPORATION
Reel/Frame 038906/0030 →