Protection device for handling energy transients
View Patent ↗A protection device for handling energy transients includes a plurality of basic unit Zener diodes connected in series to achieve a desired breakdown voltage. Each of the basic unit Zener diodes is formed in a first-type substrate. Each of the basic unit Zener diodes comprises a second-type well formed in the substrate, a second-type Zener region formed in the second-type well and a first-type+ region formed over the second-type Zener region between a first and second second-type+ region.
1. A protection circuit for MOSFETS driving inductive loads, comprising:
a plurality of independently switched MOSFETs each having a source and a drain connected in series with a separate inductive load;
a plurality of basic unit Zener diodes connected in series to form a stacked Zener diode external of the MOSFETs, the stacked Zener diode having a cathode and an anode and having a desired breakdown voltage less than the breakdown voltages of the MOSFETs, wherein each of the basic unit Zener diodes is formed in a first-type substrate, and wherein each of the basic unit Zener diodes comprises:
a second-type well formed in the substrate;
a second-type Zener region formed in the second-type well; and
a first-type+ region formed over the second-type Zener region between a first and second second-type+ region,
wherein the drain of each of the plurality of MOSFETs is coupled through a separate pass diode to the cathode of the stacked Zener diode and the source of each of the plurality of MOSFETs is coupled to a point of common potential with the anode of the stacked Zener diode, each of the pass diodes having a cathode connected to the cathode of the stacked Zener diode.
2. The circuit of claim 1 , wherein the relationship between the second-type Zener region and the first-type+ region is such that breakdown only occurs below an upper surface of the substrate.
3. The circuit of claim 1 , further comprising:
a plurality of first-type+ channel stops formed in the substrate, wherein the channel stops are shorted to the cathode of the stacked Zener diode.
4. The circuit of claim 1 , wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 4 Volts to about 8 Volts.
5. The circuit of claim 4 , wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 6.0 Volts to about 6.5 Volts.
6. The circuit of claim 1 , wherein the stacked Zener diode includes at least eight basic unit Zener diodes connected in series to form a stack.
7. The circuit of claim 6 , wherein the stacked Zener diode includes a plurality of the stacks coupled in parallel to achieve a desired current handling capacity.
8. A protection circuit for MOSFETS driving inductive loads, comprising:
a plurality of independently switched MOSFETs each having a source and a drain connected in series with a separate inductive load;
a plurality of basic unit Zener diodes connected in series to form a stacked Zener diode external of the MOSFETs, the stacked Zener diode having a cathode and an anode and having a desired breakdown voltage less than the breakdown voltages of the MOSFETs wherein each of the basic unit Zener diodes is formed in an N-type substrate, and wherein each of the basic unit Zener diodes comprises:
a P-type well formed in the substrate;
a P-type Zener region formed in the P-type well; and
an N+ region formed over the P-type Zener region between a first and second P+ region wherein the drain of each of the plurality of MOSFETs is coupled through a separate pass diode to the cathode of the stacked Zener diode and the source of each of the plurality of MOSFETs is coupled to a point of common potential with the anode of the stacked Zener diode, each of the pass diodes having a cathode connected to the cathode of the stacked Zener diode.
9. The circuit of claim 8 , wherein the relationship between the P-type Zener region and the N+ region is such that breakdown only occurs below an upper surface of the substrate.
10. The circuit of claim 8 , further comprising:
a plurality of N+ channel stops formed in the substrate, wherein the channel stops are shorted to the cathode of the stacked Zener diode.
11. The circuit of claim 8 , wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 4 Volts to about 8 Volts.
12. The circuit of claim 11 , wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 6.0 Volts to about 6.5 Volts.
13. The circuit of claim 8 , wherein the stacked Zener diode includes at least eight basic unit Zener diodes connected in series to form a stack.
14. The circuit of claim 13 , wherein the stacked Zener diode includes a plurality of the stacks coupled in parallel to achieve a desired current handling capacity.
15. A protection circuit for MOSFETS driving inductive loads, comprising:
a plurality of independently switched MOSFETs each having a source and a drain connected in series with a separate inductive load;
a plurality of basic unit Zener diodes connected in series to form a stacked Zener diode external of the MOSFETs, the stacked Zener diode having a cathode and an anode and having a desired breakdown voltage less than the breakdown voltages of the MOSFETs, wherein each of the basic unit Zener diodes is formed in an N-type substrate, and wherein each of the basic unit Zener diodes comprises:
a P-type well formed in the substrate;
a P-type Zener region formed in the P-type well; and
an N+ region formed over the P-type Zener region between a first and second P+ region, wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 4 Volts to about 8 Volts and wherein the drain of each of the plurality of MOSFETs is coupled through a separate pass diode to the cathode of the stacked Zener diode and the source of each of the plurality of MOSFETs is coupled to a point of common potential with the anode of the stacked Zener diode, each of the pass diodes having a cathode connected to the cathode of the stacked Zener diode.
16. The circuit of claim 15 , wherein the relationship between P-type Zener region and the N+ region is such that breakdown only occurs below an upper surface of the substrate.
17. The circuit of claim 15 , further comprising:
a plurality of N+ channel stops formed in the substrate, wherein the channel stops are shorted to the cathode of the stacked Zener diode.
18. The circuit of claim 15 , wherein each of the basic unit Zener diodes has a breakdown voltage in the range of about 6.0 Volts to about 6.5 Volts.
19. The circuit of claim 15 , wherein the stacked Zener diode includes at least eight basic unit Zener diodes connected in series to form a stack.
20. The circuit of claim 19 , wherein the stacked Zener diode includes a plurality of the stacks coupled in parallel to achieve a desired current handling capacity.