Apparatus for measuring photo diodes' temperature dependence
View Patent ↗A system for measuring gains of a plurality of photo diodes includes a chamber adapted to host the plurality of photo diodes and a temperature control unit configured to control the temperature within the chamber to a predetermined temperature. A control unit selects at least one of the plurality of photo diodes. A hosting unit is configured to provide a bias voltage to the selected photo diode at the predetermined temperature. A light source transmits photo signals to the selected photo diode at the predetermined temperature. A measurement unit configured to measure current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature.
1. A system for measuring amplification gain factors of a plurality of photo diodes, comprising
a chamber adapted to host the plurality of photo diodes;
a temperature control unit configured to control the temperature within the chamber to a predetermined temperature;
a control unit configured to select at least one of the plurality of photo diodes;
a hosting unit configured to provide a bias voltage to the selected photo diode at the predetermined temperature;
a light source configured to transmit a photo signals to the selected photo diode at the predetermined temperature; and
a measurement unit configured to measure a current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature to produce an electronic signal, wherein the control unit is configured to compute an amplification gain factor of the selected photo diode under the bias voltage at the predetermined temperature using the electronic signal.
2. The system of claim 1 , wherein the control unit is configured to send a bias control signal to the hosting unit to provide the bias voltage to the selected at least one photo diode.
3. The system of claim 2 , wherein the hosting unit comprises a digital potentiometer configured to receive the bias control signal from the control unit and to generate the bias voltage for the selected at least one photo diode in response to the bias control signal.
4. The system of claim 1 , further comprising:
a USB interface in the control unit; and
a power interface configured to receive a power supply signal from the USB interface and to provide power to the hosting unit.
5. The system of claim 1 , further comprising:
a booster circuit configured to generate a bias voltage for the selected at least one photo diode in response to the bias control signal; and
a channel switch circuit comprising an array of single-pole-single-throw relays, wherein at least one of the single-pole-single-throw relays is configured to receive a channel select signal from the control circuit and to allow the bias voltage to be applied to the selected at least one photo diode in response to the channel select signal.
6. The system of claim 1 , further comprising:
a data/control interface unit configured to receive a selection signal from the control unit to select at least one of the plurality of photo diodes.
7. The system of claim 1 , further comprising:
a photo splitter configured to switch the photo signals from the light source to transmit to the selected photo diode.
8. The system of claim 1 , further comprising:
a photo attenuator configured to attenuate the intensity of the photo signals from the light source to transmit to the selected photo diode.
9. The system of claim 1 , wherein the plurality of photo diodes include at least one Avalanche Photo Diode.
10. A system for measuring amplification gain factors of a plurality of photo diodes, comprising
a chamber adapted to host the plurality of photo diodes;
a temperature control unit configured to control the temperature within the chamber to a predetermined temperature;
a control unit configured to select at least one of the plurality of photo diodes and to send a bias control signal;
a booster circuit comprising a digital potentiometer, configured to receive the bias control signal from the control unit wherein the digital potentiometer generates a bias voltage for the selected photo diode in response to the bias control signal;
a light source configured to transmit photo signals to the selected photo diode at the predetermined temperature;
a measurement unit configured to measure current signals generated by the selected photo diode in response to the photo signals under the bias voltage at the predetermined temperature, wherein the control unit is configured to receive the measured current signals from the measurement unit and to compute the amplification gain factor of the selected photo diode at the predetermined temperature using the measured current signals.
11. The system of claim 10 , further comprising:
a photo splitter configured to switch the photo signals from the light source to transmit to the selected photo diode.
12. The system of claim 10 , further comprising:
a photo attenuator configured to attenuate the intensity of the photo signals from the light source to transmit to the selected photo diode.
13. The system of claim 10 , wherein the plurality of photo diodes include at least one Avalanche Photo Diode.
14. A method for measuring amplification gain factors of a plurality of photo diodes, comprising:
controlling the environment of a plurality of photo diodes to a predetermined temperature;
selecting a first photo diode from the plurality of photo diodes;
providing a bias voltage to the first photo diode at the predetermined temperature;
transmitting a photo signals at a predetermined intensity to the first photo diode at the predetermined temperature;
measuring a current signals generated by the first photo diode at the predetermined temperature in response to the photo signal to produce an electronic signal; and
computing an amplification gain factor of the first photo diode under the bias voltage at the predetermined temperature using the electronic signal and the predetermined intensity.
15. The method of claim 14 , further comprising:
providing a plurality of bias voltages to the first photo diode at the predetermined temperature; and
computing amplification gain factors of the first photo diode under the plurality of bias voltages at the predetermined temperatures.
16. The method of claim 15 , further comprising:
controlling the environment of a plurality of photo diodes to a plurality of predetermined temperatures; and
computing amplification gain factors of the first photo diode under the bias voltage diode at the plurality of predetermined temperatures.
17. The method of claim 16 , further comprising:
storing the computed amplification gain factors of the first photo diode as a function of temperature and the bias voltage; and
compensating temperature variation in the amplification gain factor of the first photo diode by varying bias voltage.
18. The method of claim 14 , further comprising:
selecting a second photo diode from the plurality of photo diodes;
providing a bias voltage to the second photo diode at the predetermined temperature;
transmitting photo signals at a the predetermined intensity to the second photo diode at the predetermined temperature;
measuring current signals generated by the second photo diode at the predetermined temperature in response to the photo signals; and
computing the amplification gain factor of the second photo diode under the bias voltage at the predetermined temperature using the measured current signals and the predetermined intensity.
19. The method of claim 14 , further comprising:
producing photo signals by a light source; and
switching the photo signals to transmit to the first photo diode.
20. The method of claim 14 , further comprising:
producing photo signals by a light source; and
adjusting the intensity of the photo signals by a photo attenuator to produce attenuated photo signals to be received by the first photo diode.