IP Library Granted Patent US 7,220,953
Granted Patent B2
US 7,220,953 · App. 11/084,584 · Granted May 22, 2007

Photodiode circuit with improved response time

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,220,953
App. No.
11/084,584
Granted
May 22, 2007
Kind
B2
Abstract

A circuit has a voltage source, a node, a photodetector electrically coupled between the voltage source and the node, a resistor electrically coupled between the node and ground, and a voltage clamp electrically connected to the node, the voltage clamp configured to maintain a reverse bias of the photodetector above a predetermined level.

Claims (36)

1. A circuit comprising:

a voltage source;

a node;

a photodetector electrically coupled between the voltage source and the node;

a resistor electrically coupled between the node and ground; and

a voltage clamp electrically connected to the node, the voltage clamp configured to maintain a reverse bias of the photodetector above a predetermined level.

2. The circuit of claim 1 wherein the photodetector is a PIN diode.

3. The circuit of claim 1 wherein the voltage source is Vcc.

4. The circuit of claim 1 wherein the voltage clamp comprises a plurality of bipolar transistors.

5. The circuit of claim 1 wherein the voltage clamp includes at least two bipolar transistors coupled in cascade between the node and ground.

6. The circuit of claim 1 wherein the voltage clamp includes a Zener diode electrically coupled between the node and ground.

7. The circuit of claim 6 further comprising a diode electrically coupled between the Zener diode and ground.

8. The circuit of claim 1 wherein the voltage clamp includes a bandgap voltage reference.

9. The circuit of claim 8 further including a bipolar transistor having a base terminal, wherein the bandgap voltage reference is electrically coupled to the base terminal.

10. The circuit of claim 1 wherein the voltage clamp activates at a first voltage and clamps at a second voltage.

11. A circuit comprising:

a node;

a photodetector coupled to the node in a configuration that is operable to provide a reverse-bias voltage across the photodetector; and

a voltage clamp circuit coupled to the node, the voltage clamp circuit configured to place the node at a clamp voltage that is selected to enable a fast response of the photodetector.

12. The circuit of claim 11 , wherein the photodetector is one of a photodiode, a phototransistor, and a PIN diode.

13. The circuit of claim 11 , wherein the voltage clamp circuit comprises a transistor that is operable to have a base-emitter voltage V BE whereby the clamp voltage is set at approximately V BE above ground potential.

14. The circuit of claim 11 , wherein the voltage clamp circuit comprises a pair of transistors that is operable to have a base-emitter voltage V BE in each of the pair of transistors, and whereby the clamp voltage is set at approximately twice V BE above ground potential.

15. The circuit of claim 11 , wherein the voltage clamp circuit comprises a zener diode operable to produce a zener voltage V Z whereby the clamp voltage is set at approximately V Z above ground potential.

16. The circuit of claim 11 , further comprising:

a resistor coupled to the node in a configuration that is operable to develop a node voltage at the node, the node voltage being determined by the magnitude of a current flowing through the resistor; and wherein

the voltage clamp circuit comprises:

a bandgap voltage reference circuit configured to generate a first voltage reference V 1 ;

a voltage supply configured to provide a voltage V t1 ;

a switch operable to selectively couple the voltage V t1 to the node; and

a logic circuit configured to detect the voltage difference between the first voltage reference V 1 and the node voltage and accordingly place the switch in one of an open and a closed position.

17. A circuit comprising:

a node;

a photodetector coupled to the node in a configuration that is operable to provide a reverse-bias voltage across the photodetector; and

a voltage clamp circuit coupled to the node, the voltage clamp circuit configured to place the node at a clamp voltage that is selected to maintain the reverse-bias voltage across the photodetector at a level wherein the photodetector is operating in a non-fully depleted photoconductive mode.

18. The circuit of claim 17 , wherein the photodetector is a PIN diode and wherein operating in the non-fully depleted photoconductive mode comprises maintaining a capacitance C PIN of the PIN diode below a predetermined level.

19. The circuit of claim 17 , wherein the photodetector is a PIN diode and wherein operating in the non-fully depleted photoconductive mode comprises maintaining a depletion region of the PIN diode above a predetermined level.

Assignments (1)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 017206 FRAME: 0666. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2016
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 038632/0662 →