Hard drive test fixture
The present invention is a method and apparatus for testing electrical or optical devices. The invention includes a test fixture having a top component, a first rail and a second rail coupled to the top component, and a connection component coupled to the first and second rails, wherein the test fixture is configured to receive 2.5 inch hard drives.
1 . A test fixture comprising:
(a) a top component;
(b) a first rail and a second rail coupled to the top component;
(c) a connection component removably coupled to the first and second rails; and
(d) an insert component configured to be removably insertable into the test fixture.
2 . The test fixture of claim 1 wherein the test fixture is configured to receive 2.5 inch hard drives of variable dimensions.
3 . The test fixture of claim 1 wherein the test fixture is stackable.
4 . The test fixture of claim 1 further comprising at least one roller disposed within a recess in each of the first and second rails.
5 . The fixture of claim 1 further comprising a first rail receiving component and a second rail receiving component coupled to the first and second rails, respectively.
6 . The fixture of claim 5 further comprising a base component coupled to the first and second rail receiving components.
7 . The fixture of claim 1 further comprising an ejection mechanism coupled to the fixture, the ejection mechanism comprising two rods selectively extendable through apertures in the first and second rail receiving components.
8 . The fixture of claim 1 wherein the connection component is configured to interface with a device to be tested.
9 . The fixture of claim 1 , wherein the first rail comprises a first slot and the second rail comprises a second slot, wherein each of the first and second slots are configured to receive the connection component.
10 . The fixture of claim 1 , wherein the first rail comprises a first receiving component and the second rail comprises a second receiving component, wherein each of the first and second receiving components are configured to receive the connection component.
11 . The fixture of claim 10 , wherein the first and second receiving components are configured to receive a first and second retention component, respectively, whereby the connection component is removably retainable in coupled connection with the first and second rails.
12 . A test pan comprising:
(a) a computer component coupled to the pan;
(b) a connector operably coupled to the computer component; and
(c) an interface controller component removeably coupled to the pan, wherein the interface controller component is operably and removably coupled to the connector.
13 . The test pan of claim 12 , wherein the computer component is removably coupled to the pan and operably and removably coupled to the connector.
14 . The test pan of claim 12 , further comprising a power component coupled to the connector.
15 . The test pan of claim 14 , wherein the power component is operably and removably coupled to the connector.
16 . The test pan of claim 12 , wherein the interface controller component is operably connected to a connection component of a test fixture via a cable, wherein the interface controller component and the connection component are configured to be substantially simultaneously removable.
17 . The test pan of claim 16 wherein the interface controller component, the connector, the connection component, and the cable are configured to be substantially simultaneously removable.
18 . A method of testing a device comprising:
inserting a insert component into a fixture comprising:
a top component;
a first rail and a second rail coupled to the top component; and
a connection component coupled to the first and second rails; and
inserting the device into the fixture;
performing at least one test on the device; and
removing the device from the test fixture.