Stacked package integrated circuit

1. An integrated circuit package with

at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate

wherein balls of the ball grid array have a size that allows packing the memory module on top of the stacked die package, and

wherein balls of the ball grid array have a size that is at least 0.5 mm.

2. The integrated circuit package of claim 1 , wherein a ball pitch of the ball grid array allows packing the memory module on top of the stacked die package.

3. The integrated circuit package of claim 1 , wherein a ball pitch of the ball grid array is at least 0.8 mm.

4. The integrated circuit package of claim 1 , wherein the single mold cap has a thickness that defines ball size, ball pitch, or both, for packing the memory module on top of the stacked die package.

5. The integrated circuit package of claim 3 , wherein the single mold cap has a thickness of 375 μm.

6. The integrated circuit package of claim 1 , wherein the dies of the bottom module comprise application specific integrated circuits, or memory modules, or any combination thereof.

7. A system comprising

at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate

wherein balls of the ball grid array have a size that allows packing the memory module on top of the stacked die package, and

wherein balls of the ball grid array have a size that is at least 0.5 mm.

8. An electronic device comprising an integrated circuit package with at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate

wherein balls of the ball grid array have a size that allows packing the memory module on top of the stacked die package, and

wherein balls of the ball grid array have a size that is at least 0.5 mm.

9. A method for assembling an integrated circuit package comprising

providing at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

stacking at least one memory module on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate

wherein balls of the ball grid array have a size that allows packing the memory module on top of the stacked die package, and

wherein balls of the ball grid array have a size that is at least 0.5 mm.

10. The method of claim 9 , comprising stacking the memory module on top of the bottom module by solder bonding.

11. The method of claim 9 , comprising wirebonding the dies of the bottom package with the substrate.

12. An integrated circuit package with

at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate,

wherein the single mold cap has a thickness that defines ball size, ball pitch, or both, for packing the memory module on top of the stacked die package.

13. The integrated circuit package of claim 12 , wherein the single mold cap has a thickness of 375 μm.

14. A system comprising

at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate,

wherein the single mold cap has a thickness that defines ball size, ball pitch, or both, for packing the memory module on top of the stacked die package.

15. An electronic device comprising an integrated circuit package with at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and at least one memory module stacked on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate,

wherein the single mold cap has a thickness that defines ball size, ball pitch, or both, for packing the memory module on top of the stacked die package.

16. A method for assembling an integrated circuit package comprising

providing at least one bottom module with a stacked die package comprising at least two dies within one single mold cap and a substrate carrying the stacked die package and comprising connection elements, and

stacking at least one memory module on top of the bottom module using a ball grid array, wherein the ball grid array connects the memory module with the connection elements of the substrate,

wherein the single mold cap has a thickness that defines ball size, ball pitch, or both, for packing the memory module on top of the stacked die package.