Entangled photon spectroscopy for stand-off detection and characterization
View Patent ↗A system for and method of detecting and characterizing materials using entangled photons is presented. The material may be at a great distances from the detector and may be biological material, complex organic compounds, or inorganic chemicals. The disclosed system and method provide advantages over traditional techniques in that they are largely impervious to atmospheric reduction of probing radiation and in that less probing radiation is required. The reduced probe energy requirement allows for detecting and characterizing sensitive material with significantly reduced material bleaching compared with traditional techniques.
1. A method of determining spectroscopic properties of a material, the method comprising:
producing entangled photons having a known value of at least one entangled photon parameter;
directing the entangled photons having the known value of at least one entangled photon parameter to a material over a distance of at least one kilometer;
observing indicia of entangled photon absorption by the material;
deducing at least one spectroscopic property of the material based on at least the indicia of entangled photon absorption and the known value of at least one entangled photon parameter; and
outputting a signal representing the at least one spectroscopic property.
2. The method of claim 1 wherein the at least one entangled photon parameter is selected from the group consisting of: entanglement area, entanglement time, sum frequency, idler photon frequency, interbeam delay, and polarization.
3. The method of claim 1 wherein the at least one spectroscopic property of the material is selected from the group consisting of: at least one energy difference value, at least one transition matrix magnitude, at least one cross section, a spectral analysis function, and at least one energy level difference.
4. The method of claim 1 wherein the at least one spectroscopic property of the material comprises a function of at least one variable, the at least one variable selected from the group consisting of: entanglement area, entanglement time, energy, sum frequency, idler photon frequency, and interbeam delay.
5. The method of claim 1 wherein the material is selected from the group consisting of: a nerve agent, spores, bacteria, viruses, amino acids, a material with a radioactive isotope, and chlorine gas.
6. The method of claim 1 wherein the indicia of entangled photon absorption is selected from the group consisting of: fluorescence, phosphorescence, direct electron transfer, and ionization.
7. The method of claim 1 wherein the material is selected from the group consisting of: a gas, a solid, a liquid, an aerosol, and a colloid.
8. The method of claim 1 wherein the material is an organic chemical.
9. The method of claim 1 further comprising identifying the material by comparing the deduced at least one spectroscopic property of the material with stored spectroscopic data.
10. The method of claim 1 wherein the step of producing comprises producing entangled photons having characteristics favorable for transmission through atmosphere.
11. The method of claim 10 wherein the step of producing comprises producing entangled photons having characteristics favorable for transmission through local atmosphere.
12. The method of claim 1 wherein the step of directing comprises directing the entangled photons a distance of at least ten kilometers to the material.
13. The method of claim 1 wherein the step of producing occurs at a different location from the step of observing.
14. The method of claim 1 wherein the step of producing comprises producing entangled photons configured to minimize bleaching of the material.
15. The method of claim 1 further comprising producing entangled photons having a second known value of the at least one entangled photon parameter, and repeating the steps of directing, observing, and deducing.
16. The method of claim 15 wherein the entangled photons having the known value of the at least one entangled photon parameter and the entangled photons having the second known value of the at least one known entangled photon parameter have the same sum frequency.
17. A system for determining spectroscopic properties of a material, the system comprising:
a source of entangled photons configured to produce entangled photons having a known value of at least one entangled photon parameter;
optics configured to direct the entangled photons having the known value of at least one entangled photon parameter to a material over a distance of at least one kilometer;
optics configured to observe indicia of entangled photon absorption by the material; and
a processor configured to compute at least one spectroscopic property of the material based on at least the indicia of entangled photon absorption and the known value of at least one entangled photon parameter.
18. The system of claim 17 wherein the entangled photon parameter is selected from the group consisting of: entanglement area, entanglement time, sum frequency, idler photon frequency, interbeam delay, and polarization.
19. The system of claim 17 wherein the at least one spectroscopic property of the material is selected from the group consisting of: at least one energy difference value, at least one transition matrix magnitude, at least one cross section, a spectral analysis function, and at least one energy level difference.
20. The system of claim 17 wherein the at least one spectroscopic property of the material comprises a function of at least one variable, the at least one variable selected from the group consisting of: entanglement area, entanglement time, energy, sum frequency, idler photon frequency, and interbeam delay.
21. The system of claim 17 wherein the material is selected from the group consisting of: a nerve agent, spores, bacteria, viruses, amino acids, a material with a radioactive isotope, and chlorine gas.
22. The system of claim 17 wherein the indicia of entangled photon absorption is selected from the group consisting of: fluorescence, phosphorescence, direct electron transfer, and ionization.
23. The method of claim 17 wherein the material is selected from the group consisting of: a gas, a solid, a liquid, an aerosol, and a colloid.
24. The system of claim 17 wherein the material is an organic chemical.
25. The system of claim 17 further comprising stored spectroscopic data and a processor configured to identify the material by comparing the deduced at least one spectroscopic property of the material with the stored spectroscopic data.
26. The system of claim 17 wherein the step of producing comprises producing entangled photons having characteristics favorable for transmission through atmosphere.
27. The system of claim 26 wherein the step of producing comprises producing entangled photons having characteristics favorable for transmission through local atmosphere.
28. The system of claim 17 wherein the optics configured to direct the entangled photons are configured to direct the entangled photons a distance of at least ten kilometers to the material.
29. The system of claim 17 wherein the optics configured to direct are at a different location from the optics configured to observe.
30. The system of claim 17 wherein the source of entangled photons is configured to produce entangled photons configured to minimize bleaching of the material.
31. The system of claim 17 wherein the source of entangled photons is configured to produce entangled photons having a second known value of the at least one entangled photon parameter.
32. The system of claim 31 wherein the entangled photons having a known value of at least one entangled photon parameter and the entangled photons having a second known value of at least one entangled photon parameter have the same sum frequency.
33. A system for determining spectroscopic properties of a material, the system comprising:
means for producing entangled photons having a known value of at least one entangled photon parameter;
means for directing the entangled photons having the known value of at least one entangled photon parameter to a material over a distance of at least one kilometer;
means for observing indicia of entangled photon absorption by the material; and
means for computing at least one spectroscopic property of the material based on at least the indicia of entangled photon absorption and the known value of at least one entangled photon parameter.