IP Library Granted Patent US 7,391,092
Granted Patent B2
US 7,391,092 · App. 11/088,995 · Granted Jun 24, 2008

Integrated circuit including a temperature monitor element and thermal conducting layer

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Quick Facts
Patent No.
US 7,391,092
App. No.
11/088,995
Granted
Jun 24, 2008
Kind
B2
Abstract

In a semiconductor integrated circuit device, a sheet-like temperature monitor member of vanadium oxide is provided, whose one end is connected to one via while the other end is connected to another via. A sheet-like thermal conducting layer of aluminum is provided below the temperature monitor member. A region equal to or greater than a half of the entire temperature monitor member overlies the thermal conducting layer in a plan view.

Claims (51)

1. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature; and

a thermal conducting layer containing a metal and/or an alloy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element,

wherein said thermal conducting layer provides a uniform temperature to said temperature monitor element.

2. The integrated circuit device according to claim 1 , wherein wires not connected to said temperature monitor element and said thermal conducting layer are provided outside of a space defined between said temperature monitor element and said thermal conducting layer.

3. The integrated circuit device according to claim 1 , wherein said thermal conducting layer is provided under said temperature monitor element.

4. The integrated circuit device according to claim 1 , wherein said thermal conducting layer comprises:

a first portion located at one of a region lying directly above, and a region lying directly under, said temperature monitor element; and

a second portion coupled to said first portion and located at one of a region off said region lying directly above, and said region lying directly under, said temperature monitor element.

5. The integrated circuit device according to claim 4 , wherein at least a part of said second portion is provided sideways of said temperature monitor element.

6. The integrated circuit device according to claim 1 , wherein said thermal conducting layer comprises at least one metal selected from a group consisting of aluminum, copper and titanium, an alloy of said metal, and an alloy essentially consisting of at least two metals from said group.

7. The integrated circuit device according to claim 1 , wherein said temperature monitor element comprises vanadium oxide.

8. The integrated circuit device according to claim 1 , wherein said thermal conducting layer is connected to said temperature monitor element.

9. The Integrated circuit device according to claim 1 , further comprising a substrate on which said temperature monitor element and said thermal conducting layer are provided and to which said thermal conducting layer is connected.

10. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature;

a thermal conducting layer containing a metal and/or an alloy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element;

a substrate;

a multi-layer wiring structure which is provided on said substrate and on which said temperature monitor element and said thermal conducting layer are provided; and

a logic circuit section provided at a top surface of said substrate and wiring layers located below a topmost layer of said multi-layer wiring structure, said temperature monitor element being provided at said topmost layer of said multi-layer wiring structure.

11. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature;

a thermal conducting layer containing a metal and/or an alloy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element; and

a insulating material,

wherein said temperature monitor element, said two wires, and said thermal conductor layer are formed in said insulating material.

12. The integrated circuit device according to claim 11 , wherein heat is conducted through said thermal conducting layer and said insulating material to provide a uniform temperature to said temperature monitor element.

13. The integrated circuit device according to claim 11 , further comprising:

a substrate to which said thermal conducting layer is connected,

wherein heat accumulated in said thermal conducting layer can be discharged through said insulating material to said substrate.

14. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature; and

a thermal conducting layer containing a metal and/or an ahoy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element,

wherein said thermal conducting layer is connected to said temperature monitoring element to permit heat accumulated in said thermal conducting layer to be discharged to said temperature monitoring element.

15. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature;

a thermal conducting layer containing a metal and/or an alloy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element; and

a substrate to which said thermal conducting layer is connected,

wherein heat accumulated in said thermal conducting layer can be discharged to said substrate.

16. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature;

a thermal conducting layer containing a metal and/or an alloy provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element; and

a logic circuit provided at an upper surface portion of said substrate and connected to said temperature monitor element,

wherein said logic circuit provides at least one of data processing of a signal from said temperature monitor element, and storing of data processed from said temperature monitor element.

17. An integrated circuit device comprising:

a temperature monitor element which is connected between two wires and whose electric resistance changes according to a temperature;

a thermal conducting layer comprising a metal provided at least one of above and under said temperature monitor element and overlying a region one of equal to and greater than a half of said temperature monitor element as seen from a direction perpendicular to a top surface of said temperature monitor element; and

an insulating material, said temperature monitor element and said thermal conducting layer formed in said insulating material,

wherein heat is transferred to said temperature monitor from the thermal conducting layer via said insulating material disposed between said temperature monitor and said thermal conducting layer.

18. The integrated circuit device according to claim 17 , further comprising:

a logic circuit connected to said temperature monitor element and formed in said insulating material,

wherein said logic circuit provides at least one of data processing of a signal from said temperature monitor element, and storing of data processed from said temperature monitor element.

Assignments (4)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2015
From: NEC CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 036022/0471 →
CHANGE OF NAME Recorded Nov 11, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025346/0859 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 24, 2005
From: OHKUBO, HIROAKI; NAKASHIBA, YASUTAKA; MURASE, HIROSHI; ODA, NAOKI; SASAKI, TOKUHITO; ITO. NOBUKAZU; KAWAHARA, NAOYOSHI
To: NEC ELECTRONICS CORPORATION; NEC CORPORATION
Reel/Frame 016419/0421 →