IP Library Granted Patent US 7,372,569
Granted Patent B2
US 7,372,569 · App. 11/089,962 · Granted May 13, 2008

Method of correcting alignment errors in a segmented reflective surface

Assignee: Optical Physics Company
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Quick Facts
Patent No.
US 7,372,569
App. No.
11/089,962
Granted
May 13, 2008
Kind
B2
Abstract

An optical alignment apparatus comprising a plurality of subapertures and a plurality of detectors. The subapertures are optically coupled to a reflective surface which formed by a plurality of adjustable reflective segments. Each subaperture falls within one of two subsets. The first subset includes those subapertures that are positioned to receive light reflected from a single reflective segment. The second subset includes those subapertures that are positioned to receive light reflected across the abutting edges of adjacent reflective segments. Each detector is disposed at a focal plane of one of the subapertures and receives light reflected from that subaperture.

Claims (29)

1. A method of correcting alignment errors in a segmented reflective surface, the method comprising:

receiving through a subaperture an image reflected across abutting edges of adjacent reflective segments of the reflective surface, the adjacent reflective segments having an unknown piston difference;

deriving a phase plateau value using spatial frequencies of the image;

resolving the unknown piston difference using the phase plateau value; and

adjusting a piston position of at least one of the adjacent reflective segments.

2. The method of claim 1 , wherein deriving a phase plateau value includes determining optical path differences for select spatial frequencies and deriving the phase plateau value from the optical path differences.

3. The method of claim 1 , wherein the spatial frequencies are characterized by separations in a predetermined direction.

4. The method of claim 3 , wherein the spatial frequencies are further characterized by separations which are greater than d/2, where d represents a maximum width of the subaperture in the predetermined direction.

5. A method of correcting alignment errors in a segmented reflective surface, the method comprising:

receiving through a subaperture an image reflected across abutting edges of adjacent reflective segments of the reflective surface, the adjacent reflective segments having an unknown piston difference;

determining optical path differences for select spatial frequencies of the image, wherein the select spatial frequencies are characterized by separations in a predetermined direction, the separations being greater than d/2, where d represents a maximum width of the subaperture in the predetermined direction;

deriving a phase plateau value using the optical path differences;

resolving the unknown piston difference using the phase plateau value; and

adjusting a piston position of at least one of the adjacent reflective segments.

6. A method of correcting alignment errors in a segmented reflective surface, the method comprising:

receiving an image through a first subaperture following reflection of the image across abutting edges of adjacent reflective segments of the reflective surface, wherein the adjacent reflective segments have an unknown piston difference;

measuring first subaperture intensities at select spatial frequencies of the image; calculating a first subaperture image Fourier Transform (FT) for each of the measured first subaperture intensities;

determining a first subaperture Optical Transfer Function (OTF) at the select spatial frequencies;

deriving a phase plateau value using each first subaperture image FT and each first subaperture OTF;

resolving the unknown piston difference using the phase plateau value; and

adjusting a piston position of at least one of the adjacent reflective segments.

7. The method of claim 6 , wherein the select spatial frequencies consist of spatial frequencies characterized by separations in a predetermined direction.

8. The method of claim 7 , wherein the select spatial frequencies consist of spatial frequencies characterized by separations which are greater than d/2, wherein d represents a maximum width of the first subaperture in the predetermined direction.

9. The method of claim 6 , wherein deriving the phase plateau value includes:

receiving the image through a second subaperture following reflection of the image off one of the two adjacent reflective segments;

measuring second subaperture intensities at the select spatial frequencies;

calculating a second subaperture image FT for each of the measured second subaperture intensities;

determining a second subaperture OTF at the select spatial frequencies; and

deriving the phase plateau value using each second subaperture image FT and each second subaperture OTF to cancel out a phase of the image within each first subaperture image FT and each first subaperture OTF.

Assignments (3)
SECURITY INTEREST Recorded May 30, 2025
From: VALLEY TECH SYSTEMS, INC.; ZIN TECHNOLOGIES, INC.; NANORACKS LLC; SPACE MICRO INC.; OPTICAL PHYSICS COMPANY
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 071270/0811 →
SECURITY INTEREST Recorded May 30, 2025
From: VOYAGER TECHNOLOGIES, INC.; VOYAGER SPACE IP HOLDINGS, LLC; DREAMUP, PBC; SPACE MICRO INC.; ZIN TECHNOLOGIES, INC.; NANORACKS LLC; VALLEY TECH SYSTEMS, INC.; PIONEER INVENTION, LLC; ALTIUS SPACE MACHINES, INC.; OPTICAL PHYSICS COMPANY
To: HERCULES CAPITAL, INC., AS AGENT
Reel/Frame 071276/0168 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2005
From: HUTCHIN, RICHARD A.
To: OPTICAL PHYSICS COMPANY
Reel/Frame 017012/0210 →
Continuity (1)
Related Publication 20060215160A1 · Sep 28, 2006