IP Library Granted Patent US 7,355,895
Granted Patent B2
US 7,355,895 · App. 11/090,273 · Granted Apr 8, 2008

Nonvolatile semiconductor memory and driving method the same

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Quick Facts
Patent No.
US 7,355,895
App. No.
11/090,273
Granted
Apr 8, 2008
Kind
B2
Abstract

A nonvolatile semiconductor memory includes a memory cell array, a control circuit and an address control circuit. In the memory cell array, a plurality of memory cells are arranged in a matrix of rows and columns. The control circuit sets a write/erase mode in response to an erase instruction, and to count the erase instruction. The address control circuit generates a write address from an input address for a write operation based on a count value from the control circuit in the write/erase mode. A write order to the memory cells accessed based on a series of the write addresses in a current write operation is different from a write order to the memory cells accessed based on a series of write addresses in a previous write operation.

Claims (68)

1. A nonvolatile semiconductor memory comprising:

a memory cell array in which a plurality of memory cells are arranged in a matrix of rows and columns;

a control circuit configured to set a write/erase mode in response to erase instructions; and

an address control circuit;

wherein:

said address control circuit is configured to produce write addresses to cause specific memory cells of the plurality of memory cells to be written in a certain write order when said write/erase mode is set by the control circuit in response to a first erase instruction; and

said address control circuit is configured to produce write addresses to cause the specific memory cells to be written in a particular write order different from said certain write order when said write/erase mode is set by the control circuit in response to another erase instruction issued after said first erase instruction.

2. The nonvolatile semiconductor memory according to claim 1 ,

wherein said particular write order is opposite to said certain write order in units of the rows of said memory cells.

3. The nonvolatile semiconductor memory according to claim 2 ,

wherein said control circuit is configured to provide a count value based on a number of times said write/erase mode has been set,

wherein said address control circuit is configured to produce write addresses from input addresses for write operations in said write/erase mode based on said count value,

wherein said address control circuit is connected with address lines on which an input address having a row address portion and a column address portion is supplied, and

wherein said address control circuit comprises:

inverters connected to said address lines corresponding to said row address portion;

a logic circuit configured to generate a switch control signal based on said count value in said write/erase mode; and

switches, each of which outputs an inverted output of said inverter connected with a corresponding one of said address lines corresponding to said row address portion in response to said switch control signal.

4. The nonvolatile semiconductor memory according to claim 3 ,

wherein said switches output said input address supplied on said address lines as an internal address when said write/erase mode is not set.

5. The nonvolatile semiconductor memory according to claim 1 ,

wherein said particular write order is opposite to said certain write order in units of the columns of said memory cells.

6. The nonvolatile semiconductor memory according to claim 5 ,

wherein said control circuit is configured to provide a count value based on a number of times said write/erase mode has been set,

wherein said address control circuit is configured to produce write addresses from input addresses for write operations in said write/erase mode based on said count value,

wherein said address control circuit is connected with address lines on which an input address having a row address portion and a column address portion is supplied, and

wherein said address control circuit comprises:

inverters connected to said address lines corresponding to said column address portion;

a logic circuit configured to generate a switch control signal based on said count value in said write/erase mode; and

switches, each of which outputs an inverted output of said inverter connected with a corresponding one of said address lines corresponding to said column address portion in response to said switch control signal.

7. The nonvolatile semiconductor memory according to claim 6 ,

wherein said switches output said input address supplied on said address lines as an internal address when said write/erase mode is not set.

8. The nonvolatile semiconductor memory according to claim 1 ,

wherein said particular write order is opposite to said certain write order.

9. The nonvolatile semiconductor memory according to claim 8 ,

wherein said control circuit is configured to provide a count value based on a number of times said write/erase mode has been set,

wherein said address control circuit is configured to produce write addresses from input addresses for write operations in said write/erase mode based on said count value,

wherein said address control circuit is connected with address lines on which an input address having a row address portion and a column address portion is supplied, and

wherein said address control circuit comprises:

inverters connected to said address lines;

a logic circuit configured to generate a switch control signal based on said count value in said write/erase mode; and

switches, each of which outputs inverted outputs of said inverters in response to said switch control signal.

10. The nonvolatile semiconductor memory according to claim 9 ,

wherein said switches output said input address supplied on said address lines as an internal address when said write/erase mode is not set.

11. A method of driving a nonvolatile semiconductor memory, comprising:

providing a memory cell array in which a plurality of memory cells are arranged in a matrix of rows and columns;

setting a write/erase mode in response to a first erase instruction;

generating write addresses to cause specific memory cells of the plurality of memory cells to be written in a certain write order when the write/erase mode is set in response to the first erase instruction;

setting the write/erase mode in response to another erase instruction issued after said first erase instruction; and

generating write addresses to cause the specific memory cells to be written in a particular write order different from said certain write order when said write/erase mode is set in response to said another erase instruction.

12. The method according to claim 11 ,

wherein said particular write order is opposite to said certain write order in units of the rows of said memory cells.

13. The method according to claim 12 , wherein said generating write addresses to cause the specific memory cells to be written in the particular write order, comprises:

inverting address bits of a row address portion of an input address; and

generating as a write address, the inverted address bits for said row address portion and non-inverted address bits for a column address portion in said write/erase mode.

14. The method according to claim 13 , further comprising:

generating said input address as an internal address when said write/erase mode is not set.

15. The method according to claim 11 ,

wherein said particular write order is opposite to said certain write order in units of the columns of said memory cells.

16. The method according to claim 15 , wherein said generating write addresses to cause the specific memory cells to be written in the particular write order, comprises:

inverting address bits of a column address portion of said input address; and

generating as a write address, non-inverted address bits for said row address portion and the inverted address bits for a column address portion in said write/erase mode.

17. The method according to claim 16 , further comprising:

generating said input address as an internal address when said write/erase mode is not set.

18. The method according to claim 11 ,

wherein said particular write order is opposite to said certain write order.

19. The method according to claim 18 , wherein said generating write addresses to cause the specific memory cells to be written in the particular write order, comprises:

inverting address bits of an input address; and

outputting as a write address the inverted address bits in said write/erase mode.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Nov 11, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025346/0859 →