Semiconductor device characteristics measurement apparatus and connection apparatus

1. A connection apparatus for connecting a measurement apparatus and a device under test, which is a semiconductor device, the connection apparatus comprising:

switching means, connected to the device under test, for receiving a control signal from controlling means;

a preamplifier connected to the switching means;

first connector that is connected to the preamplifier and that is connectable to first measuring means for measuring a first electrical characteristic of the device under test; and

second connector that is connected to the switching means and that is connectable to second measuring means for measuring a second electrical characteristic of the device under test;

wherein the switching means comprises at least one switch that switches between a first wiring configuration for electrically connecting the first measuring means to the device under test via the first connector and the preamplifier and a second wiring configuration for electrically connecting the second measuring means to the device under test via the second connector in accordance with the control signal from the controlling means, the first wiring configuration being suitable for measuring the first electrical characteristic and the second wiring configuration being suitable for measuring the second electrical characteristic; and

the preamplifier amplifies current signals and/or voltage signals for the first measuring means.

2. The connection apparatus according to claim 1 , wherein the preamplifier comprises micro-current amplifying means for amplifying the current signals.

3. The connection apparatus according to claim 1 , wherein, when the first wiring configuration electrically connects the first measuring means to the device under test, a first signal path from the first measuring means to the device under test is accompanied by a first feedback path from the device under test to the first measuring means, the first feedback path corresponding to the first signal path; and when the second wiring configuration electrically connects the second measuring means to the device under test, a second signal path from the second measuring means to the device under test is accompanied by a second feedback path from the device under test to the second measuring means, the second feedback path corresponding to the second signal path.

4. The connection apparatus according to claim 1 , wherein the switching means comprises a first switching portion included in a first signal path connected to one terminal of the device under test and a second switching portion included in a second signal path connected to another terminal of the device under test; and

the first switching portion and the second switching portion operate in conjunction with each other under control of the controlling means to switch between the first wiring configuration and the second wiring configuration.

5. The connection apparatus according to claim 4 , wherein the first switching portion and the second switching portion comprise signal feedback terminals that are connectable with each other.

6. The connection apparatus according to claim 1 , wherein the controlling means is arranged together with at least one of the first measuring means and the second measuring means to control the switching means.

7. The connection apparatus according to claim 1 , wherein the controlling means synchronizes with operation of at least one of the first measuring means and the second measuring means to perform control such that the switching means performs a switching operation.

8. The connection apparatus according to claim 1 , wherein one of the first measuring means and the second measuring means comprises at least one of an impedance measurement unit, a pulse generator, and a current-voltage characteristic measurement unit.