Three-dimensional measuring apparatus for scanning an object and a measurement head of a three-dimensional measuring apparatus and method of using the same

1. A measurement head for a three-dimensional measuring apparatus, the measurement head being configured to forward an optical beam towards an object in a transmission direction through the measurement head, and to receive an optical beam reflected from the object in a reception direction through the measurement head, wherein the measurement head comprises:

a support of the measurement head and a rotatable part of the measurement head, wherein the rotatable part of the measurement head being rotatable around first axis in relation to the support of the measurement head and the measurement head comprising a first rotating means for rotating the rotatable part of the measurement head around the first axis in relation to the support of measurement head;

in the rotatable part of the measurement head having a reflective guiding arrangement comprising at least one reflecting means, wherein the reflective guiding arrangement being configured to receive optical beam and to guide the optical beam further in the transmission direction and the reflective guiding arrangement being in a substantially fixed location within the rotatable part of the measurement head;

in the rotatable part of the measurement head having a rotatable reflecting means configured to receive optical beam from the reflective guiding arrangement, wherein said rotatable reflecting means being configured to be tilted in relation to a second axis and configured to forward the optical beam towards the object, the rotational position of the rotatable reflecting means being configured to define the position of the deflection path of the optical beam on the surface of the object, and the deflection path being formed as the rotatable part of the measurement head is rotated around the first axis;

in the rotatable part of the measurement head having means for rotating the rotatable reflecting means in relation to the second axis, and said second axis being in perpendicular relation with respect to the first axis;

the measurement head being configured in such a way that in the rotatable part of the measurement head having the reflective guiding arrangement is configured to receive the optical beam in a direction that is co-axial with the first axis, and the measurement head being further configured in such a way that the rotatable reflecting means is configured to receive the optical beam from the reflective guiding arrangement in a direction that is co-axial with the second axis; and

the apparatus comprising also an optical source for creating the optical beam to be transmitted through the measurement head in the transmission direction, a stop detector for receiving the optical beam through the measurement head in the reception direction and also a control unit, the apparatus being such that the optical source, the stop detector and control unit are located in the apparatus elsewhere than in the rotating part of the measurement head.

2. The apparatus of claim 1 , wherein the rotatable reflecting means is in a substantially 45 degrees tilted position in relation to the second axis.

3. The apparatus of claim 1 , wherein the reflective guiding arrangement is in a substantially 45 degrees tilted position in relation to the first axis.

4. The apparatus of claim 1 , wherein the reflective guiding arrangement is substantially 45 degrees tilted in relation to the second axis.

5. The apparatus of claim 1 , wherein the reflective guiding arrangement comprises a reflective surface and this reflective surface is configured to receive the optical beam and also to guide the optical beam to the rotatable reflecting means.

6. The apparatus of claim 1 , wherein the reflective guiding arrangement comprises first, second and third reflecting means, and that the first reflecting means is arranged to receive the optical beam and to turn the optical beam to a direction perpendicular to the first axis, and that the second reflecting means is arranged to receive the optical beam from the first reflecting means and to turn the optical beam to a direction parallel with the first axis, and that the third reflecting means is arranged to receive the optical beam from the second reflecting means and to turn the optical beam to a direction coaxial with the second axis towards the rotatable reflecting means.

7. The apparatus of claim 1 , wherein an optical fiber arrangement for guiding the optical beam towards the rotatable reflecting means is used instead of the reflective guiding arrangement.

8. The apparatus of claim 1 , wherein the optical source, the detector(s) and the control unit are located in the apparatus elsewhere than in the measurement head.

9. The apparatus of claim 1 , wherein the optical source, the detector(s) and control unit are located in the apparatus in the support of the measurement head in relation to which support the rotating part of the measurement head is rotatable.

10. The apparatus of claim 1 , wherein the optical source, detector(s), and control unit are separate from the measurement head wherein the optical connection between these elements and the measurement head is through optical fiber.

11. The apparatus of claim 10 , wherein the optical source, detector(s), and control unit are physically separated from the measurement head, wherein the optical connection between these elements and the measurement head is through a direct optical beam.

12. A measurement head for a three-dimensional measuring apparatus, the measurement head being configured to forward an optical beam towards an object in a transmission direction through the measurement head, and to receive an optical beam reflected from the object in a reception direction through the measurement head, wherein the measurement head comprises:

a support of the measurement head and a rotatable part of the measurement head, wherein the rotatable part of the measurement head being rotatable around first axis in relation to the support of the measurement head and the measurement head comprising a first rotating means for rotating the rotatable part of the measurement head around the first axis in relation to the support of measurement head;

in the rotatable part of the measurement head having a reflective guiding arrangement comprising at least one reflecting means, wherein the reflective guiding arrangement being configured to receive optical beam and to guide the optical beam further in the transmission direction and the reflective guiding arrangement being in a substantially fixed location within the rotatable part of the measurement head;

in the rotatable part of the measurement head having a rotatable reflecting means configured to receive optical beam from the reflective guiding, wherein said rotatable reflecting means being configured to be tilted in relation to a second axis and configured to forward the optical beam towards the object, the rotational position of the rotatable reflecting means being configured to define the position of the deflection path of the optical beam on the surface of the object, and the deflection path being formed as the rotatable part of the measurement head is rotated around the first axis;

in the rotatable part of the measurement head having means for rotating the rotatable reflecting means in relation to the second axis, said second axis being in perpendicular relation with respect to the first axis; and

the measurement head being configured in such a way that in the rotatable part of the measurement head having the reflective guiding arrangement is configured to receive the optical beam in a direction that is co-axial with the first axis, and the measurement head being further configured in such a way that the rotatable reflecting means is configured to receive the optical beam from the reflective guiding arrangement in a direction that is co-axial with the second axis.

13. The measurement head of claim 12 , wherein the rotatable reflecting means is in a substantially 45 degrees tilted position in relation to the second axis.

14. The measurement head of claim 12 , wherein the reflective guiding arrangement is in a substantially 45 degrees tilted position in relation to the first axis.

15. The measurement head of claim 12 , wherein the reflective guiding arrangement is substantially 45 degrees tilted in relation to the second axis.

16. The measurement head of claim 12 , wherein the reflective guiding arrangement comprises a reflective surface and this reflective surface is configured to receive the optical beam and also to guide the optical beam to the rotatable reflecting means.

17. The measurement head of claim 12 , wherein the reflective guiding arrangement comprises first, second and third reflecting means, and that the first reflecting means is arranged to receive the optical beam and to turn the optical beam to a direction perpendicular to the first axis, and that the second reflecting means is arranged to receive the optical beam from the first reflecting means and to turn the optical beam to a direction parallel with the first axis, and that the third reflecting means is arranged to receive the optical beam from the second reflecting means and to turn the optical beam to a direction coaxial with the second axis towards the rotatable reflecting means.

18. The measurement head of claim 12 , wherein the measurement head comprises an optical source, detector(s), and control unit, and that the optical source, the detectors(s) and control unit are located in support of the measurement head or are protected by the support of the measurement head in relation to which support the rotating part of the measurement head is rotatable.