Test head for optically inspecting workpieces
View Patent ↗Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for detecting reflected laser light. The directions of the laser beams are selected so as to reduce or prevent cross-talk interference between the upper and lower test heads.
1. Apparatus comprising:
a first optical head for inspecting a first surface of a planar workpiece, said first optical head comprising a first light source for providing a first light beam in a first direction toward said first surface and a first detector for detecting reflected light from said first surface, said first direction not being perpendicular to said first surface;
a second optical head for inspecting a second surface of said workpiece, said second optical head comprising a second light source for providing a second light beam in a second direction toward said second surface and a second detector for detecting reflected light from said second surface, said second direction not being perpendicular to said second surface;
the planes of incidence of said first and second light beams being at an angle, wherein if said workpiece is not present, said first light beam does not travel toward said second detector and said second light beam does not travel toward said first detector.
2. Apparatus of claim 1 wherein the planes of incidence of said first and second light beams are closer to antiparallel than parallel.
3. Apparatus of claim 1 wherein said workpiece is a platter and said first and second surfaces are inspected simultaneously.
4. Apparatus comprising:
a first optical head for inspecting a first surface of a planar workpiece, said first optical head comprising a first light source for providing a first light beam in a first direction toward said first surface and a first detector for detecting reflected light from said first surface, said first direction not being perpendicular to said first surface;
a second optical head for inspecting a second surface of said workpiece, said second optical head comprising a second light source for providing a second light beam in a second direction toward said second surface and a second detector for detecting reflected light from said second surface, said second direction not being perpendicular to said second surface;
the planes of incidence of said first and second light beams being at an angle to reduce or eliminate cross-optical-coupling between said first and second heads when said workpiece is not present or when one or both of said first and second light beams approaches an outer edge of said workpiece.
5. Apparatus of claim 4 wherein said angle prevents or reduces the amount of light from said first beam from reflecting off of an object and reaching said second detector when said first light beam approaches an outer edge of said workpiece, said angle also preventing or reducing the amount of light from said second beam reflecting off of an object and reaching said first detector when said second light beam approaches an outer edge of said workpiece.
6. Apparatus of claim 5 wherein said first detector receives light scattered by said first surface and said second detector receives light scattered by said second surface.
7. Apparatus of claim 5 wherein said first head comprises a first lens for collecting light reflected from said first surface of said workpiece and a first mirror for reflecting said collected light toward said first detector, and wherein said second head comprises a second lens for collecting light reflected from said second surface of said workpiece and a second mirror for reflecting said collected light toward said second detector.
8. Apparatus of claim 5 wherein said first head further comprises a first plurality of lenses for collecting light reflected from said first surface and a first plurality of detectors for receiving said collected light, said second head further comprising a second plurality of lenses for collecting light reflected from said second surface and a second plurality of detectors for receiving said collected light.
9. Apparatus of claim 4 wherein said workpiece is a platter.
10. A method comprising:
providing a first beam of light in a first direction toward a first side of a workpiece such that said first beam reflects off of said first side and strikes a first detector;
providing a second beam of light in a second direction toward a second side of said workpiece such that said second beam reflects off of said second side and strikes a second detector,
the planes of incidence of said first and second light beams being at an angle, wherein if said workpiece is not present, said first light beam does not travel toward said second detector and said second light beam does not travel toward said first detector.
11. Method of claim 10 wherein the planes of incidence of said first and second beams of light are closer to antiparallel than parallel.
12. Method of claim 10 wherein said workpiece is a platter.
13. A method comprising:
providing a first beam of light in a first direction toward a first side of a workpiece such that said first beam reflects off of said first side and strikes a first detector;
providing a second beam of light in a second direction toward a second side of said workpiece such that said second beam reflects off of said second side and strikes a second detector,
said first and second heads arranged so that the planes of incidence of said first and second light beams are at an angle to reduce or eliminate cross-optical-coupling between said first and second heads when said workpiece is not present or when one or both of said light beams approaches an outer edge of said workpiece.
14. Method of claim 13 wherein said angle prevents or reduces the amount of light from said first beam reflecting off an object toward said second detector and the amount of light from said second beam reflecting off an object toward said first detector.
15. Method of claim 13 wherein said first detector receives light scattered by said first surface and said second detector receives light scattered by said second surface.
16. Method of claim 13 wherein said workpiece is a platter.
17. Apparatus of claim 1 wherein said angle is greater than 0 degrees and less than 20 degrees.
18. Apparatus of claim 1 wherein said workpiece does not transmit light.
19. Apparatus of claim 4 wherein said angle is greater than 0 degrees and less than 20 degrees.
20. Apparatus of claim 4 wherein said workpiece does not transmit light.
21. Method of claim 10 wherein said angle is greater than 0 degrees and less than 20 degrees.
22. Method of claim 10 wherein said workpiece does not transmit light.
23. Method of claim 13 wherein said angle is greater than 0 degrees and less than 20 degrees.
24. Method of claim 13 wherein said workpiece does not transmit light.
25. Apparatus of claim 1 wherein said first and second detectors receive light that is specularly reflected from said workpiece.
26. Apparatus of claim 4 wherein said first and second detectors receive light that is specularly reflected from said workpiece.
27. Method of claim 10 wherein said first and second detectors receive light that is specularly reflected from said workpiece.
28. Method of claim 13 wherein said first and second detectors receive light that is specularly reflected from said workpiece.