Low non-linear error displacement measuring interferometer
View Patent ↗An interferometer is provided that minimizes the introduction of non-linear errors into displacement measurements. In one embodiment, non-linear errors are reduced by isolating reference and measurement beams over most of their respective optical paths leading to the detector, and by employing a separate amplitude-splitting non-polarizing optical beam splitter for each beam input into the interferometer. Additionally, the interferometer is scalable to an arbitrary number of optical axes or inputs.
1. A interferometer assembly, comprising:
a first input rhomb sub-assembly having a first input surface and a first output surface, a first amplitude-splitting non-polarizing interface being disposed therewithin;
a second input rhomb sub-assembly having a second input surface and a second output surface, a second amplitude-splitting non-polarizing interface being disposed therewithin;
a polarizing beam splitter sub-assembly comprising at least first, second and third faces and having a polarizing beam splitter interface located therewithin;
wherein the first output surface of the first input rhomb sub-assembly is attached to the first face of the polarizing beam splitter sub-assembly, the second output surface of the second input rhomb sub-assembly is attached to the second face of the polarizing beam splitter sub-assembly, the input rhomb and the polarizing beam splitter sub-assemblies being configured and attached to one another to permit first and second beams having first and second frequencies, respectively, to enter the interferometer assembly spatially separated through the first and second input surfaces, respectively, the first and second amplitude-splitting non-polarizing interfaces splitting the first and second beams.
2. The interferometer assembly of claim 1 , further comprising a first quarter wave plate having a first input face.
3. The interferometer assembly of claim 2 , wherein the first input face of the first quarter wave plate is attached to the third face of the polarizing beam splitter sub-assembly.
4. The interferometer assembly of claim 1 , further comprising a second quarter wave plate having a second input face.
5. The interferometer assembly of claim 4 , wherein the second input face of the second quarter wave plate is attached to the third face of the polarizing beam splitter sub-assembly.
6. The interferometer assembly of claim 1 , wherein the interferometer assembly is configured to operate as a single-pass interferometer.
7. The interferometer assembly of claim 1 , wherein the interferometer assembly is configured to operate as a dual-pass interferometer.
8. The interferometer assembly of claim 1 , wherein the interferometer assembly is configured to operate as an interferometer having three or more optical axes.
9. The interferometer assembly of claim 1 , wherein the interferometer assembly further comprises at least one cube corner for reflecting at least one of a measurement beam and a reference beam.
10. An interferometer assembly comprising first and second input rhomb amplitude-splitting non-polarizing sub-assemblies, and a polarizing beam splitter sub-assembly, the first and second input rhomb sub-assemblies being configured to receive, transmit and reflect by amplitude-splitting means spatially separated first and second beams, respectively, the first and second beams having first and second frequencies, output beams from the input rhomb assemblies being directed into the polarizing beam splitter and a polarizing beam splitter interface disposed therewithin.
11. The interferometer assembly of claim 10 , further comprising a first quarter wave plate attached to the polarizing beam splitter sub-assembly, the first quarter wave plate being configured to receive and reflect the first beam.
12. The interferometer assembly of claim 10 , further comprising a second quarter wave plate attached to the polarizing beam splitter sub-assembly, the second quarter wave plate being configured to receive and transmit the second beam.
13. The interferometer assembly of claim 10 , wherein at least one of the first input rhomb sub-assembly and the second input rhomb sub-assembly comprises first and second volumes of optical-grade glass glued together along first and second surfaces, the glued interface between the first and second surfaces forming an amplitude-splitting interface.
14. The interferometer assembly of claim 10 , further comprising at least a third input rhomb amplitude-splitting non-polarizing sub-assembly for receiving a third beam, the third beam having a frequency different from the first and second beams.
15. The interferometer assembly of claim 10 , wherein the assembly is monolithic.
16. A method of making an interferometer assembly, the method comprising:
providing a first input rhomb sub-assembly having a first input surface and a first output surface, a first amplitude-splitting non-polarizing interface being disposed therewithin;
providing a second input rhomb sub-assembly having a second input surface and a second output surface, a second amplitude-splitting non-polarizing interface being disposed therewithin;
providing a polarizing beam splitter sub-assembly comprising at least first, second and third faces and having a polarizing beam splitter interface located therewithin;
attaching the first output surface of the first input rhomb sub-assembly directly to the first face of the polarizing beam splitter sub-assembly;
attaching the second output surface of the second input rhomb sub-assembly directly to the second face of the polarizing beam splitter sub-assembly;
wherein the input rhomb and the polarizing beam splitter sub-assemblies are configured and attached to one another to permit first and second beams having first and second frequencies, respectively, to enter the interferometer assembly spatially separated through the first and second input surfaces, respectively, the first and second amplitude-splitting non-polarizing interfaces being configured to split the first and second beams.
17. The method of claim 16 , wherein the first output surface is glued to the first face.
18. The method of claim 16 , wherein the second output surface is glued to the first face.