IP Library Granted Patent US 7,298,640
Granted Patent B2
US 7,298,640 · App. 11/121,145 · Granted Nov 20, 2007

1T1R resistive memory array with chained structure

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Quick Facts
Patent No.
US 7,298,640
App. No.
11/121,145
Granted
Nov 20, 2007
Kind
B2
Abstract

A 1T1R resistive memory array comprised of chains of memory cells, where each memory cell is composed of a resistive element in parallel with a switch. Such chains of memory cells are non-volatile and provide for each of the memory cells to be randomly accessed.

Claims (10)

1. An electronic memory comprising a plurality of memory cells, each memory cell including:

a switch;

a resistive memory element connected in parallel with said switch, said resistive memory element capable of existing in one of a plurality of resistive states, each resistive state representing a different data state; and

a memory write and read circuit selectably coupled to said resistive memory element and capable of writing a data state to said resistive memory element and reading the data state;

wherein said plurality of memory cells are arranged in a row/column configuration, each row/column configuration including a plurality of said resistive memory elements connected in series and a plurality of said switches connected in series, each of said switches associated with one of said resistive memory elements; and

said memory further comprising a source of a programming voltage and a row/column selection transistor connected between said source of the programming voltage and said row/column of memory cells.

2. The electronic memory according to claim 1 , further comprising a sense amplifier and a row/column sense transistor connected between said sense amplifier and said row/column of memory cells.

3. The electronic memory according to claim 1 , wherein said resistive memory element includes a material selected from the group consisting of colossal magnetoresistance (CMR) materials and high temperature superconductivity (HTSC) materials.

4. The electronic memory according to claim 1 , wherein said resistive memory element is composed of Pr 0.7 Ca 0.3 MnO 3 .

5. The electronic memory according to claim 1 , wherein each of said memory cells has a maximum size of 4F 2 .

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 053362/0177 →
CHANGE OF NAME Recorded Jun 15, 2020
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 052945/0722 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2005
From: CHEN, ZHENG; PAZ DE ARAUJO, CARLOS A.; MCMILLAN, LARRY D.
To: SYMETRIX CORPORATION; MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 016573/0608 →