IP Library Patent Application 11123012
Patent Application
App. No. 11/123,012

Organic light emitting display and method of fabricating the same

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Quick Facts
Patent No.
US None
App. No.
11/123,012
Abstract

An organic light emitting display (OLED) and method of fabricating the same are provided having a reduced number of photolithography and etching steps. The method includes a source electrode and a drain electrode being formed over a substrate, and at least one insulating layer being formed over the source electrode and drain electrode. After the insulation layer is formed, a reflecting layer pattern is formed. A via contact hole is formed through the insulating layer using the reflecting layer pattern as an etching mask. Multiple insulating layers may be formed and have a via contact hole etched therethrough in one etching step using the reflecting layer pattern as a mask. Alternatively, each insulating layer may have a via contact hole separately etched therethrough, with the last layer being etched using the reflective layer pattern as a mask. Consequently, the number of photolithography and etching steps is reduced thereby leading to higher manufacturing yield and lower manufacturing cost.

Claims (43)

1 . An organic light emitting display (OLED), comprising:

a passivation layer including a first via contact hole formed therethrough, wherein the passivation layer is arranged above a substrate on which a thin film transistor having a gate electrode, a source electrode and a drain electrode are formed, wherein the first via contact hole exposes either one of the source electrode or the drain electrode;

a stacked structure comprising a planarization layer pattern and a reflecting layer pattern formed above the passivation layer, wherein the planarization layer pattern and the reflecting layer include a second via contact hole therethrough exposing the first via contact hole, and share an etching surface in a thin film transistor region;

a pixel electrode formed on the reflecting layer pattern and contacting either the source electrode or the drain electrode through the second via contact hole; and

an insulating layer pattern formed above portions of the passivation layer and the pixel electrode and exposing a pixel region while filling at least a portion of the second via contact hole.

2 . The OLED of claim 1 , wherein the planarization layer pattern is made of a material selected from a group of materials consisting of polyimide, benzocyclobutene-based resin, spin on glass (SOG), and acrylate.

3 . The OLED of claim 1 , wherein the reflecting layer pattern comprises a metal selected from a group of metals consisting of aluminum, silver, or an alloy of silver and aluminum.

4 . An organic light emitting display (OLED), comprising:

a stacked structure including a first insulating layer pattern and a reflecting layer pattern formed above a substrate, a thin film transistor including a gate electrode, a source electrode, and a drain electrode formed on the substrate, wherein the first insulating layer pattern and the reflecting layer pattern comprise a via contact hole therethrough which exposes either the source electrode or the drain electrode and share an etching surface in a thin film transistor region;

a pixel electrode formed on the reflecting layer pattern and contacting either the source electrode or the drain electrode through the via contact hole; and

a second insulating layer pattern formed above predetermined portions of the thin film transistor and the pixel electrode and exposing a portion of the pixel electrode to define a pixel region and filling at least a portion of the via contact hole.

5 . The OLED of claim 4 , wherein the first insulating layer pattern comprises a material selected from a group of materials consisting of polyimide, benzocyclobutene-based resin, spin on glass (SOG), and acrylate.

6 . The OLED of claim 4 , wherein the first insulating layer pattern comprises a stacked structure including a planarization layer and a passivation layer.

7 . The OLED of claim 6 , wherein the passivation layer comprises any one of a silicon nitride layer, a silicon oxide layer, and a stack of a silicon nitride layer and a silicon oxide layer.

8 . The OLED of claim 4 , wherein the reflecting layer pattern comprises a metal selected from a group of metals consisting of aluminum, silver, or an alloy of silver and aluminum.

9 . A method of fabricating an organic light emitting display (OLED), comprising:

forming a buffer layer having a predetermined thickness on a substrate, and forming a thin film transistor including a gate electrode, a source electrode and a drain electrode;

forming a passivation layer above the buffer layer;

etching the passivation layer to form a first via contact hole which exposes either the source electrode or the drain electrode;

forming a planarization layer on predetermined portions of the passivation layer and forming a reflecting layer on predetermined portions of the planarization layer;

etching the reflecting layer to form a reflecting layer pattern;

etching the planarization layer using the reflecting layer pattern as an etching mask to form a second via contact hole which exposes the first via contact hole;

forming a pixel electrode contacting either the source electrode or the drain electrode through the first via contact hole and the second via contact hole; and

forming an insulating layer pattern on a predetermined portion of the pixel electrode to define a pixel region on the OLED.

10 . The method of claim 9 , wherein the planarization layer comprises a material selected from a group of materials consisting of polyimide, benzocyclobutene-based resin, spin on glass (SOG), and acrylate.

11 . The method of claim 9 , wherein the reflecting layer pattern comprises a metal selected from a group of metals consisting of aluminum, silver, or an alloy of silver and aluminum.

12 . The method of claim 9 , wherein the reflecting layer is etched by either a wet-etching method or a dry-etching method.

13 . The method of claim 9 , wherein the planarization layer is etched by a dry-etching method using oxygen plasma.

14 . The method of claim 9 , wherein the planarization layer is etched by a dry-etching method using a plasma with either one of a CF 4 or a SF 6 gas and comprising at least oxygen and fluorine when the planarization layer comprises silicon.

15 . A method of fabricating an organic light emitting display (OLED), comprising:

forming a buffer layer including a predetermined thickness on a substrate, and forming a thin film transistor including a gate electrode, a source electrode and a drain electrode on the buffer layer;

forming a first insulating layer over the buffer layer and forming a reflecting layer over the first insulating layer;

etching the reflecting layer to form a reflecting layer pattern;

etching the first insulating layer using the reflecting layer pattern as an etching mask to form a via contact hole therethrough which exposes either one of the source electrode or the drain electrode;

forming a pixel electrode coupled to either one of the source electrode or the drain electrode through the via contact hole; and

forming a second insulating layer pattern to define a pixel region on the OLED.

16 . The method of claim 15 , wherein the first insulating layer is made of a material selected from a group of materials consisting of polyimide, benzocyclobutene-based resin, spin on glass (SOG), and acrylate.

17 . The method of claim 15 , wherein the first insulating layer comprises a passivation layer under a planarization layer.

18 . The method of claim 17 , wherein the passivation layer is formed of one of either a silicon nitride layer, a silicon oxide layer, or a stack of a silicon nitride layer and a silicon oxide layer.

19 . The method of claim 15 , wherein the reflecting layer pattern comprises a metal selected from a group of metals consisting of aluminum, silver, or an alloy of aluminum and silver.

20 . The method of claim 15 , wherein the reflecting layer is etched by either a wet-etching method or a dry-etching method.

21 . The method of claim 15 , wherein the planarization layer is etched by a dry-etching method using oxygen plasma.

22 . The method of claim 15 , wherein the planarization layer is etched by a dry-etching method using a plasma with either one of a CF 4 or SF 6 gas containing at least oxygen and fluorine when the planarization layer contains silicon.

Assignments (4)
MERGER Recorded Aug 29, 2012
From: SAMSUNG MOBILE DISPLAY CO., LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 028868/0425 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2008
From: SAMSUNG SDI CO., LTD.
To: SAMSUNG MOBILE DISPLAY CO., LTD.
Reel/Frame 022024/0026 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 5, 2006
From: KANG, TAE-WOOK; SEO, SEONG-MOH; SEO, CHANG-SU; SHIN, HYUN-EOK; LEE, KWAN-HEE; CHO, YU-SUNG
To: SAMSUNG SDI CO., LTD.
Reel/Frame 017877/0793 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2005
From: KANG, TAE-WOOK; SEO, SEONG-MOH; SEO, CHANG-SU; CHO, YU-SUNG; SHIN, HYUN-EOK
To: SAMSUNG SDI CO., LTD.
Reel/Frame 016539/0967 →