IP Library Granted Patent US 7,573,924
Granted Patent B2
US 7,573,924 · App. 11/127,083 · Granted Aug 11, 2009

Nitride semiconductor laser device

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Quick Facts
Patent No.
US 7,573,924
App. No.
11/127,083
Granted
Aug 11, 2009
Kind
B2
Abstract

A nitride semiconductor laser device includes a nitride semiconductor laser element having a resonator end surface and capable of emitting light with a wavelength of at most 420 nm, a heat sink joined to the nitride semiconductor laser element, a stem with the heat sink mounted thereon, and a light detecting element mounted on the stem for detecting a laser beam from the nitride semiconductor laser element. The nitride semiconductor laser element, the heat sink and the light detecting element are enclosed within a cap that is joined to the stem, and an atmosphere within the cap has a dew point of at most −30° C. and an oxygen concentration of at most 100 ppm.

Claims (27)

1. A nitride semiconductor laser device comprising:

a nitride semiconductor laser element having a resonator end surface; and

a stem having said nitride semiconductor laser element, wherein

said nitride semiconductor laser element is enclosed within a cap that is joined to said stem, and

an atmosphere hermetically sealed within said cap the atmosphere having a dew point of at most −30° C. and an oxygen concentration of at most 100 ppm, wherein

said atmosphere comprises at least one selected from a group consisting of helium, argon, and nitrogen, and said atmosphere has a pressure higher than 100 kPa,

wherein the nitride semiconductor laser element is capable of emitting light with a wavelength of at most 420 nm.

2. The nitride semiconductor laser device according to claim 1 , wherein

said atmosphere includes helium.

3. The nitride semiconductor laser device according to claim 1 , wherein

said atmosphere includes nitrogen.

4. The nitride semiconductor laser device according to claim 2 , wherein

said atmosphere has a pressure higher than 100 kPa.

5. The nitride semiconductor laser device according to claim 3 , wherein

said atmosphere has a pressure higher than 100 kPa.

6. The nitride semiconductor laser device according to claim 1 , wherein

said cap has a window and said window has a thickness of at least 0.5 mm and at most 1.0 mm.

7. The nitride semiconductor laser device according to claim 1 , wherein

said cap is joined to said stem with a metal interposed therebetween.

8. The nitride semiconductor laser device according to claim 1 , wherein

a heat sink having said nitride semiconductor laser element is provided within said cap.

9. The nitride semiconductor laser device according to claim 1 , wherein

a light detecting element for detecting a laser beam from said nitride semiconductor laser element is provided within said cap.

10. The nitride semiconductor laser device according to claim 1 , wherein the atmosphere comprises at least one selected from a group consisting of helium, argon, and nitrogen, and said atmosphere has a pressure higher than 100 kPa.

11. The nitride semiconductor laser device according to claim 1 , further including a window in said cap for allowing a laser beam emitted from said nitride semiconductor laser element, wherein

said window is larger than a hole of said cap, and

said window is mounted from the inside of said cap so as to cover said hole.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2022
From: SHARP KABUSHIKI KAISHA
To: SHARP FUKUYAMA LASER CO., LTD.
Reel/Frame 059039/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2005
From: TSUDA, YUHZOH; HANAOKA, DAISUKE; ISHIDA, MASAYA
To: SHARP KABUSHIKI KAISHA
Reel/Frame 016564/0322 →