Calibration system that can be utilized with a plurality of test system topologies

1. A calibration system that is independent of a particular topology within a test system having a plurality of components that are connected to one another, comprising:

a netlist, wherein the netlist includes a list of the components contained within the test system and interconnections between the components of the test system;

a path correction module; and

a processor in signal communication with the path correction module, wherein the processor utilizes the path correction module and the netlist to determine path calibration parameters for correcting measurements made on a device under test with the test system for the effects of the components.

2. The calibration system of claim 1 , wherein the path correction module is an S-parameter simulator.

3. The calibration system of claim 2 , wherein the netlist includes:

electrical characteristics of a first component;

electrical characteristics of an at least second component; and

an S-parameter associated with both the first component and the at least second component.

4. The calibration system of claim 1 , wherein the netlist includes a database of S-parameters that characterize the components.

5. The calibration system of claim 4 , wherein a schema associated with the database is a markup language schema.

6. The calibration system of claim 1 , further including:

an application program interface in signal communication with the calibration system; and

an at least one test procedure initiating execution of the path correction module.

7. The calibration system of claim 1 , further including an input power calculation value determined by the processor via the execution of the path correction module.

8. A method for determining path calibration parameters for correcting measurements of a device under test for the effects of components from which a test system is constructed, the method comprising:

executing a path correction module by a processor;

accessing a netlist containing list of the components contained within the test system and the interconnections of the components; and

determining a path calibration parameters for correcting measurements made on a device under test with the test system for the effects of the components.

9. The method of claim 8 , wherein executing the path correction module includes executing an S-parameter simulator.

10. The method of claim 9 , where accessing the netlist includes accessing a database of S-parameters that characterize the components of the test system.

11. The method of claim 10 , where a schema associated with the database is a markup language schema.

12. The method of claim 10 , further including:

executing a test procedure; and

utilizing the path correction module in response to receipt of an instruction via an application program interface from the test procedure.

13. The method of claim 10 , further including storing an S-parameter in the database wherein the S-parameter is associated with both a first component and at least a second component.