Microscope apparatus having an objective displacement detection system
View Patent ↗The microscope apparatus has an objective lens, a sample base on which an observation sample is placed, a sensor target mounted on the tip portion of the objective lens, and a non-contact sensor mounted on the sample base. The non-contact sensor detects the distance to the sensor target. The microscope further has a motor that moves the objective lens along the optical axis and the controller that controls the motor to keep the relative distance between the tip portion of the objective lens 5 and the sample base constant while the control switch is ON.
1. A microscope apparatus, which optically observes an observation sample, comprising:
an objective lens;
a sample base on which the observation sample is placed;
a sensor target mounted on a tip portion of the objective lens;
a member which holds the objective lens and which is caused to elongate and incline by thermal expansion due to a change in ambient temperature;
a capacitance type non-contact sensor mounted on the sample base and positioned on an axis that passes through a center of the objective lens when the objective lens is not inclined and that is perpendicular to an expected inclination direction of the objective lens;
a displacement detection system that detects a relative distance between the tip portion of the objective lens and the sample base via the capacitance type non-contact sensor and the sensor target;
a moving mechanism that moves the objective lens along an optical axis relative to the sample base; and
a control unit that controls the moving mechanism based on information detected by the displacement detection system to keep the relative distance between the tip portion of the objective lens and the sample base constant, so as to maintain a focused condition.
2. A microscope apparatus according to claim 1 , further comprising an observation optical system including the objective lens, wherein the control unit adjusts the relative distance between the tip portion of the objective lens and the sample base in steps smaller than a focal depth of the observation optical system.
3. A microscope apparatus according to claim 2 , wherein the control unit includes a storage unit that stores a predetermined observation position and a relative distance between the tip portion of the objective lens and the sample base at the observation position, and adjusts the relative distance between the tip portion of the objective lens and the sample base to the relative distance stored in the storage unit at predetermined time intervals.
4. A microscope apparatus, which optically observes an observation sample, comprising:
an objective lens;
a sample base on which the observation sample is placed;
a member which holds the objective lens and which is caused to elongate and incline by thermal expansion due to a change in ambient temperature;
a displacement detection system which includes a sensor target and a capacitance type non-contact sensor, and which detects a relative distance between a tip portion of the objective lens and the sample base via the capacitance type non-contact sensor and the sensor target;
a moving mechanism that moves the objective lens along an optical axis relative to the sample base; and
a control unit that controls the moving mechanism based on information detected by the displacement detection system to keep the relative distance between the tip portion of the objective lens and the sample base constant, so as to maintain a focused condition,
wherein one of the sensor target and the capacitance type non-contact sensor is provided on the sample base, and the other of the sensor target and the capacitance type non-contact sensor is provided on the tip portion of the objective lens; and
wherein the capacitance type non-contact sensor is positioned on an axis which passes through a center of the objective lens when the objective lens is not inclined, and which is perpendicular to an expected inclination direction of the objective lens.
5. A microscope apparatus according to claim 4 , further comprising an observation optical system including the objective lens, wherein the control unit adjusts the relative distance between the tip portion of the objective lens and the sample base in steps smaller than a focal depth of the observation optical system.
6. A microscope apparatus according to claim 5 , wherein the control unit includes a storage unit that stores a predetermined observation position and a relative distance between the tip portion of the objective lens and the sample base at the observation position, and adjusts the relative distance between the tip portion of the objective lens and the sample base to the relative distance stored in the storage unit at predetermined time intervals.