Method and apparatus for characterizing the electric field of periodic and non-periodic optical signals
View Patent ↗An interferometric technique measures the time-dependent electric field of a periodic or a non-periodic (data-encoded) optical signal under test using samples of its interference with a reference source of short optical pulses. The reference signal is a sequence of optical pulses at a repetition rate different from that of the signal under test. The difference in repetition rates of the two signals performs a scanning of the relative delay between the two signals, i.e. each pulse from the reference signal will overlap with the signal under test at a different time. The real and imaginary part of each of the plurality of interference between the two signals are then measured to determine samples of the electric field of the optical signal under test at each of those times. When needed, various types of averaging are performed on the samples of the electric field. If the signal under test is a data-encoded source, averaging is performed on groups of samples corresponding to the same symbol state of the data-encoded source.
1. A method for characterizing the electric field of an optical signal under test that includes a sequence of optical pulses at a first repetition rate, T TEST , comprising the steps of:
combining the optical signal under test with a reference signal being a sequence of optical pulses at a second repetition rate T REF that is equal to MT TEST +δt wherein δt is a fraction of T TEST ;
measuring the real and imaginary parts of the interference of the signal under test with each optical pulse from the sequence of optical pulses of the reference signal; and
determining samples of the electric field of the optical signal under test every δt from the measured real and imaginary parts.
2. The method of claim 1 wherein
samples of the electric field of the optical signal under test measured every δt are obtained by processing and organizing the samples determined for a plurality of optical pulses from the sequence of optical pulses.
3. The method of claim 1 wherein the optical signal under test is a periodic signal.
4. The method of claim 1 wherein the optical signal under test is a non-periodic signal and wherein in the measuring step the electric field is determined separately for each different state of the non-periodic signal.
5. The method of claim 1 wherein in the measuring step the amplitude and phase of the determined samples of the electric field are separately averaged to characterize the optical signal under test.
6. The method of claim 1 wherein in the measuring step the intensity and phase of the determined samples of the electric field are separately averaged to characterize the optical signal under test.
7. The method of claim 1 wherein in the measuring step the determined samples of the electric field are averaged to characterize the optical signal under test.
8. The method of claim 1 wherein
in the measuring step an adjusted phase is determined by subtracting a linear phase component from the phase of the determined samples of the electric field and the adjusted phase is used as the phase of the electric field of the source under test.
9. The method of claim 1 wherein the optical signal under test is a data-modulated signal selected from a group including on/off keying, OOK, quadrature amplitude modulation, QAM, binary phase shift keying, BPSK, or quadrature phase shift keying, QPSK.
10. The method of claim 1 wherein the optical signal under test and reference signal are not derived from a common optical source.
11. An apparatus for characterizing the electric field of an optical signal under test that includes a first sequence of optical pulses at a first repetition rate, T TEST , comprising:
means for combining the optical signal under test with a reference signal being a second sequence of optical pulses at a second repetition rate T REF that is equal to MT TEST +δt, wherein δt is a fraction of T TEST ;
means for measuring the real and imaginary part of the interference of the signal under test with each optical pulse from the second sequence of optical pulses of the reference signal; and
means for determining samples of the electric field of the optical signal under test every δt from the measured real and imaginary parts.
12. The apparatus of claim 11 being embodied using a technology selected from a group including a free-space embodiment, a waveguide embodiment, a polarization interferometer, or an optical fiber embodiment.
13. The apparatus of claim 11 wherein the measuring means includes
a processor means for processing and organizing the samples determined for each optical pulse from the second sequence of optical pulses to obtain samples of the electric field of the optical signal under test every δt.
14. The apparatus of claim 13 wherein
the processor means calculates an adjusted phase determined by subtracting a linear phase component from the phase of the determined samples and the adjusted phase is used to characterize the phase of the source under test.
15. The apparatus of claim 13 wherein
the processor means performs an averaging function whereby the amplitude and phase of the electric field of the optical signal under test are obtained by independent averaging of the amplitude and phase of the determined samples of the electric field.
16. The apparatus of claim 13 wherein
the processor means performs an averaging function whereby the intensity and phase of the electric field of the optical signal under test are obtained by independent averaging of the intensity and phase of the determined samples of the electric field.
17. The apparatus of claim 13 wherein
the processor means performs an averaging function whereby the electric field of the optical signal under test is obtained by averaging the determined samples of the electric field.