Laser production and product qualification via accelerated life testing based on statistical modeling
View Patent ↗A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.
1. A method for facilitating maintenance of an optical system, comprising:
specifying an available operational life for a semiconductor laser;
identifying a set of operating conditions in the optical system;
calculating an acceleration factor using an accelerated life model; and
determining a revised available operational life for the semiconductor laser based on the calculated acceleration factor and the operating conditions in the optical system.
2. The method as recited in claim 1 , wherein the available operational life for the semiconductor laser represents the initial expected lifetime of the semiconductor laser after burn-in and incorporation into the optical system.
3. The method as recited in claim 2 , wherein the initial expected lifetime of the semiconductor laser is based on a model set of operating conditions for the semiconductor laser.
4. The method as recited in claim 1 , wherein the available operational life for the semiconductor laser includes information calculated based on an operational history of the semiconductor laser.
5. The method as recited in claim 4 , further comprising tracking and accumulating previous operating condition data for the semiconductor laser for use in calculating the information relating to the operational history of the semiconductor laser.
6. The method as recited in claim 1 , wherein identifying a set of operating conditions in the optical system comprises generating a forward-looking prediction of expected operating conditions within the optical system.
7. The method as recited in claim 1 , wherein the set of operating conditions in the optical system are identified in real time.
8. The method as recited in claim 7 , wherein identifying the set of operating conditions in real time comprises monitoring at least some of the operating conditions during operation of the semiconductor laser.
9. The method as recited in claim 1 , wherein determining a revised available operational life for the semiconductor laser comprises specifying that operating conditions in the optical system are constant, so that only one acceleration factor needs to be determined.
10. The method as recited in claim 9 , wherein the available operational life is multiplied by the acceleration factor to yield the revised available operational life for the semiconductor laser.
11. The method as recited in claim 1 , wherein determining a revised available operational life for the semiconductor laser comprises calculating the available operational life for the semiconductor laser at fixed intervals based upon the operating history of the semiconductor laser.
12. The method as recited in claim 1 , wherein determining a revised available operational life for the semiconductor laser comprises constantly updating the available operational life for the semiconductor laser in real time based upon the operating history of the semiconductor laser.
13. The method as recited in claim 1 , further comprising modifying a maintenance schedule based upon the revised available operational life of the semiconductor laser.
14. A method for facilitating maintenance of an optical system, comprising:
specifying an available operational life for a semiconductor laser, wherein the operational life corresponds to operation of the semiconductor laser according to a first set of operating conditions;
identifying a second set of operating conditions for the semiconductor laser, wherein the second set of operating conditions are based on use of the semiconductor laser within an optical network;
calculating an acceleration factor using an accelerated life model based on differences between said first set of operating conditions and said second set of operating conditions;
revising the available operational life for the semiconductor laser based on the calculated acceleration factor; and
replacing the semiconductor laser when the available operational life falls below a replacement value.
15. The method as recited in claim 14 , wherein the semiconductor laser comprises a laser diode.
16. The method as recited in claim 14 , wherein identifying said second set of operating conditions comprises determining expected operating conditions for the semiconductor laser.
17. The method as recited in claim 16 , wherein revising the available operational life comprises calculating a revised operational life based on expected operating conditions for the semiconductor laser.
18. The method as recited in claim 14 , wherein identifying said second set of operating conditions comprises measuring the operating conditions of the semiconductor laser during operation of the optical network.
19. The method as recited in claim 18 , wherein revising the available operational life comprises calculating a revised operational life based on duration of operation at the measured operating conditions.
20. A method for facilitating maintenance of an optical system, comprising:
specifying an available operational life for a semiconductor laser;
identifying a set of operating conditions in the optical system;
generating an accelerated life model, wherein generating the accelerated life model comprises:
accumulating aging test data for the semiconductor laser;
using the aging test data in a failure analysis to identify parameters for a time-to-failure probability distribution function; and
fitting the probability distribution function to the parameters;
calculating an acceleration factor using the accelerated life model; and
determining a revised available operational life for the semiconductor laser based on the calculated acceleration factor and the operating conditions in the optical system.