IP Library Granted Patent US 7,221,207
Granted Patent B2
US 7,221,207 · App. 11/143,632 · Granted May 22, 2007

Semiconductor switching circuit for switching the paths of a high frequency signal in a mobile communications unit

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,221,207
App. No.
11/143,632
Granted
May 22, 2007
Kind
B2
Abstract

A semiconductor apparatus is provided which makes it possible to reduce the number of control terminals required for switching through paths of a high frequency signal, simplify the circuit configuration for controlling the terminals, improve an isolation characteristic between on path and off path of a through FET, and obtain a sufficiently high isolation. In this semiconductor apparatus, one specific through FET and each of shunt FETs connected to each of through FETs other than the one specific through FET are simultaneously turned on in response to the same control signal inputted to the same control terminal. Thus, when a high frequency signal leaks from an output terminal to the signal path of the through FET having been turned on, through the signal paths of the through FETs having been turned off, the high frequency signal can be released to GND through the shunt FET having been turned on.

Claims (14)

1. A semiconductor apparatus, comprising:

first, second, and third switch transistor circuits;

first second and third gate bias terminals, a gate of the first switch transistor circuit connected by a resistor to the first gate bias terminal, a gate of the second switch transistor circuit connected by a resistor to the second gate bias terminal, a gate of the third switch transistor circuit connected by a resistor to the third gate bias terminal;

an input terminal connected in parallel to a source of each of the first, second and third switch transistor circuits;

first, second, third, fourth, fifth, and sixth shunt transistor circuits;

a first output terminal connected to a drain of the first switch transistor circuit, the first output terminal connected to a drain of the first and second shunt transistor circuits, a source of each of the first and second shunt transistor circuits connected in parallel by a capacitor to ground, a gate of the first shunt transistor circuit connected by a resistor to the third gate bias terminal, a gate of the second shunt transistor circuit connected by a resistor to the second gate bias terminal;

a second output terminal connected to a drain of the second switch transistor circuit, the second output terminal connected to a drain of the third and fourth shunt transistor circuits, a source of each of the third and fourth shunt transistor circuits connected by a capacitor to ground, a gate of the third shunt transistor circuit connected by a resistor to the first gate bias terminal, a gate of the fourth shunt transistor circuit connected by a resistor to the third gate bias terminal; and

a third output terminal connected to a drain of the third switch transistor circuit, the third output terminal connected to a drain of the fifth and sixth shunt transistor circuits, a source of each of the fifth and sixth shunt transistor circuits connected by a capacitor to ground, a gate of the fifth shunt transistor circuit connected by a resistor to the first gate bias terminal, a gate of the sixth shunt transistor circuit connected by a resistor to the second gate bias terminal.

2. The semiconductor apparatus of claim 1 , wherein each switch transistor circuit comprises at least three transistors.

3. The semiconductor apparatus of claim 1 , wherein each shunt transistor circuit comprises at least three transistors.

4. The semiconductor apparatus of claim 1 , wherein each switch transistor circuit is comprised of a multigate field-effect transistor.

5. The semiconductor apparatus of claim 4 , wherein each gate of the multigate field-effect transistor is connected to a gate bias terminal by a resistor.

6. The semiconductor apparatus of claim 1 , wherein each shunt transistor circuit is comprised of a multigate field-effect transistor.

7. The semiconductor apparatus of claim 6 , wherein each gate of the multigate field-effect transistor is connected to a gate bias terminal by a resistor.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2014
From: PANASONIC CORPORATION
To: COLLABO INNOVATIONS, INC.
Reel/Frame 033021/0806 →
LIEN Recorded Jan 13, 2014
From: COLLABO INNOVATIONS, INC.
To: PANASONIC CORPORATION
Reel/Frame 031997/0445 →
CHANGE OF NAME Recorded Jan 8, 2014
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 031947/0358 →