IP Library Granted Patent US 7,323,920
Granted Patent B2
US 7,323,920 · App. 11/152,274 · Granted Jan 29, 2008

Soft-error rate improvement in a latch using low-pass filtering

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Quick Facts
Patent No.
US 7,323,920
App. No.
11/152,274
Granted
Jan 29, 2008
Kind
B2
Abstract

In a preferred embodiment, the invention provides a circuit and method for reducing soft error events in latches. A low-pass filter is placed between the output of a forward inverter and the inputs of a feedback keeper. The first and second outputs of the low-pass filter are connected to first and second inputs respectively of the feedback keeper. The only type of diffusion connected to the first output of the low-pass filter is a P-type diffusion. The only type of diffusion connected to the second output of the low-pass filter is an N-type diffusion. The feedback keeper is connected to an input of the forward inverter.

Claims (175)

1. A method of manufacturing a latch comprising:

a) connecting a low-pass filter between an output of a forward inverter and inputs of a feedback keeper;

b) connecting a first output of the low-pass filter to a first input of the feedback keeper;

c) connecting a second output of the low-pass filter to a second input of the feedback keeper;

d) such that the only type of diffusion attached to the first output of the low-pass filter is a P-type diffusion;

e) such that the only type of diffusion attached to the second output of the low-pass filter is an N-type diffusion;

f) wherein an output of the feedback keeper is connected to an input of the forward inverter.

2. The method as in claim 1 wherein the forward inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the forward inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the forward inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

3. The method as in claim 1 wherein the low-pass filter comprises:

a) a inverter, the inverter having an input and an output;

b) a first PFET, the first PFET having a gate, drain, and source;

c) a second PFET, the second PFET having a gate, drain, and source;

d) a third PFET, the third PFET having a gate, drain, and source;

e) a first NFET, the first NFET having a gate, drain, and source;

f) a second NFET, the second NFET having a gate, drain, and source;

g) a third NFET, the third NFET having a gate, drain, and source;

h) wherein the input of the low-pass filter is connected to the input of the inverter and the gates of the second PFET and the first NFET;

i) wherein the output of the inverter is connected to the gates of the first PFET and the second NFET;

j) wherein the sources of the first PFET, and the third PFET are connected to VDD;

k) wherein the drain of the first NFET is connected to VDD;

l) wherein the sources of the second NFET, and the third NFET are connected to GND;

m) wherein the drain of the second PFET is connected to GND;

n) wherein the gate of the third NFET is connected to a clock signal;

o) wherein the gate of the third PFET is connected to the opposite phase of the clock signal;

p) wherein the drains of the first PFET and third PFET and the source of the second PFET are connected to the first output of the low-pass filter;

q) wherein the drains of the second NFET and third NFET and the source of the first NFET are connected to the second output of the low-pass filter.

4. The method as in claim 3 wherein the inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

5. The method as in claim 1 wherein the feedback keeper comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gate of the PFET is connected to the first input of the feedback keeper;

d) wherein the gate of the NFET is connected to the second input of the feedback keeper;

e) wherein the drains of the PFET and NFET are connected to the output of the feedback keeper;

f) wherein the source of the PFET is connected to VDD;

g) wherein the source of the NFET is connected to GND.

6. A latch comprising:

a) a forward inverter;

b) a feedback keeper;

c) a low-pass filter;

d) wherein an output of the forward inverter is connected to an input of the low-pass filter;

e) wherein a first output of the low-pass filter is connected to a first input of the feedback keeper;

f) such that the only type of diffusion attached to the first output of the low-pass filter is a P-type diffusion;

g) wherein a second output of the low-pass filter is connected to a second input of the feedback keeper;

h) such that the only type of diffusion attached to the second output of the low-pass filter is an N-type diffusion;

i) wherein an output of the feedback keeper is connected to the input of the forward inverter.

7. The latch as in claim 6 wherein the forward inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the forward inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the forward inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

8. The latch as in claim 6 wherein the low-pass filter comprises:

a) a inverter, the inverter having an input and an output;

b) a first PFET, the first PFET having a gate, drain, and source;

c) a second PFET, the second PFET having a gate, drain, and source;

d) a third PFET, the third PFET having a gate, drain, and source;

e) a first NFET, the first NFET having a gate, drain, and source;

f) a second NFET, the second NFET having a gate, drain, and source;

g) a third NFET, the third NFET having a gate, drain, and source;

h) wherein the input of the low-pass filter is connected to the input of the inverter and the gates of the second PFET and the first NFET;

i) wherein the output of the inverter is connected to the gates of the first PFET and the second NFET;

j) wherein the sources of the first PFET, and the third PFET are connected to VDD;

k) wherein the drain of the first NFET is connected to VDD;

l) wherein the sources of the second NFET, and the third NFET are connected to GND;

m) wherein the drain of the second PFET is connected to GND;

n) wherein the gate of the third NFET is connected to a clock signal;

o) wherein the gate of the third PFET is connected to the opposite phase of the clock signal;

p) wherein the drains of the first PFET and third PFET and the source of the second PFET are connected to the first output of the low-pass filter;

q) wherein the drains of the second NFET and third NFET and the source of the first NFET are connected to the second output of the low-pass filter.

9. The latch as in claim 8 wherein the inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

10. The latch as in claim 6 wherein the feedback keeper comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gate of the PFET is connected to the first input of the feedback keeper;

d) wherein the gate of the NFET is connected to the second input of the feedback keeper;

e) wherein the drains of the PFET and NFET are connected to the output of the feedback keeper;

f) wherein the source of the PFET is connected to VDD;

g) wherein the source of the NFET is connected to GND.

11. A computer system, comprising:

a) at least one integrated circuit;

b) wherein at least one integrated circuit contains a latch;

c) wherein the latch comprises a forward inverter, a low-pass filter, and a feedback keeper;

d) such that the only type of diffusion attached to a first output of the low-pass filter is a P-type diffusion;

e) such that the only type of diffusion attached to a second output of the low-pass filter is an N-type diffusion.

12. The computer system as in claim 11 wherein the forward inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the forward inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the forward inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

13. The computer system as in claim 11 wherein the low-pass filter comprises:

a) a inverter, the inverter having an input and an output;

b) a first PFET, the first PFET having a gate, drain, and source;

c) a second PFET, the second PFET having a gate, drain, and source;

d) a third PFET, the third PFET having a gate, drain, and source;

e) a first NFET, the first NFET having a gate, drain, and source;

f) a second NFET, the second NFET having a gate, drain, and source;

g) a third NFET, the third NFET having a gate, drain, and source;

h) wherein the input of the low-pass filter is connected to the input of the inverter and the gates of the second PFET and the first NFET;

i) wherein the output of the inverter is connected to the gates of the first PFET and the second NFET;

j) wherein the sources of the first PFET, and the third PFET are connected to VDD;

k) wherein the drain of the first NFET is connected to VDD;

l) wherein the sources of the second NFET, and the third NFET are connected to GND;

m) wherein the drain of the second PFET is connected to GND;

n) wherein the gate of the third NFET is connected to a clock signal;

o) wherein the gate of the third PFET is connected to the opposite phase of the clock signal;

p) wherein the drains of the first PFET and third PFET and the source of the second PFET are connected to the first output of the low-pass filter;

q) wherein the drains of the second NFET and third NFET and the source of the first NFET are connected to the second output of the low-pass filter.

14. The computer system as in claim 13 wherein the inverter comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gates of the PFET and NFET are connected to the input of the inverter;

d) wherein the drains of the PFET and NFET are connected to the output of the inverter;

e) wherein the source of the PFET is connected to VDD;

f) wherein the source of the NFET is connected to GND.

15. The computer system as in claim 11 wherein the feedback keeper comprises:

a) a PFET, the PFET having a gate, drain, and source;

b) an NFET, the NFET having a gate, drain, and source;

c) wherein the gate of the PFET is connected to the first input of the feedback keeper;

d) wherein the gate of the NFET is connected to the second input of the feedback keeper;

e) wherein the drains of the PFET and NFET are connected to the output of the feedback keeper;

f) wherein the source of the PFET is connected to VDD;

g) wherein the source of the NFET is connected to GND.

16. A latch for reducing soft errors comprising:

a) a means for inverting a signal, the means for inverting a signal having an input and an output;

b) a means for maintaining a logical value on a node, the means for maintaining a logical value on a node having a first input, a second input, and an output;

c) a means for filtering high frequency content from a signal, the means for filtering high frequency content from a signal having an input, a first output, and a second output;

d) such that the only type of diffusion attached to the first output of the means for filtering high frequency content from a signal is a P-type diffusion;

e) such that the only type of diffusion attached to the second output of the means for filtering high frequency content from a signal is an N-type diffusion;

f) wherein the output of the means for inverting a signal is connected to the input of the means for filtering high frequency content from a signal;

g) wherein the first output of the means for filtering high frequency content from a signal is connected to the first input of the means for maintaining a logical value on a node;

h) wherein the second output of the means for filtering high frequency content from a signal is connected to the second input of the means for maintaining a logical value on a node;

i) wherein the output of the means for maintaining a logical value on a node is connected to the input of the means for inverting a signal.

17. A method of manufacturing a latch comprising:

a) connecting a low-pass filter between an output of a transfer gate and inputs of a feedback keeper;

b) connecting a first output of the low-pass filter to a first input of the feedback keeper;

c) connecting a second output of the low-pass filter to a second input of the feedback keeper;

d) such that the only type of diffusion attached to the first output of the low-pass filter is a P-type diffusion;

e) such that the only type of diffusion attached to the second output of the low-pass filter is an N-type diffusion;

f) wherein an output of the feedback keeper is connected to the output of the transfer gate.

18. A latch comprising:

a) a feedback keeper;

b) a low-pass filter;

c) wherein an input/output of the latch is connected to an input of the low-pass filter;

d) wherein a first output of the low-pass filter is connected to a first input of the feedback keeper;

e) such that the only type of diffusion attached to the first output of the low-pass filter is a P-type diffusion;

f) wherein a second output of the low-pass filter is connected to a second input of the feedback keeper;

g) such that the only type of diffusion attached to the second output of the low-pass filter is an N-type diffusion;

h) wherein an output of the feedback keeper is connected to the input/output of the latch.

19. A computer system, comprising:

a) at least one integrated circuit;

b) wherein at least one integrated circuit contains a latch;

c) wherein the latch comprises a low-pass filter, and a feedback keeper;

d) such that the only type of diffusion attached to a first output of the low-pass filter is a P-type diffusion;

e) such that the only type of diffusion attached to a second output of the low-pass filter is an N-type diffusion.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2021
From: OT PATENT ESCROW, LLC
To: VALTRUS INNOVATIONS LIMITED
Reel/Frame 058897/0262 →
PATENT ASSIGNMENT, SECURITY INTEREST, AND LIEN AGREEMENT Recorded Jan 26, 2021
From: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP; HEWLETT PACKARD ENTERPRISE COMPANY
To: OT PATENT ESCROW, LLC
Reel/Frame 055269/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2015
From: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
To: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Reel/Frame 037079/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 11, 2005
From: NAFFZIGER, SAMUEL D.
To: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Reel/Frame 016866/0806 →