Temperature measurement circuit calibrated through shifting a conversion reference level
View Patent ↗A temperature measurement circuit has a current excitation circuit, a temperature calculation circuit, a calibration factor generator, and an analog-to-digital conversion circuit. The current excitation circuit supplies in sequence at least two currents to a thermal sensor. At least two output signals are correspondingly generated from the thermal sensor. In response to the at least two output signals, the temperature calculation circuit calculates an analog temperature signal representative of a temperature detected by the thermal sensor. The analog-to-digital conversion circuit converts the analog temperature signal into a digital signal based on a conversion reference level. The conversion reference level is shifted in accordance with a calibration value generated from the calibration factor generator.
1. A temperature measurement circuit comprising:
a current excitation circuit for sequentially applying at least two currents to a thermal sensor, from which at least two output signals are correspondingly generated;
a calculation circuit for, in response to the at least two output signals, calculating an analog temperature signal representative of a temperature detected by the thermal sensor;
a calibration factor generator for generating a calibration factor, wherein the calibration factor is calculated when the current excitation circuit sequentially applies at least three currents to the thermal sensor, and is used for calibrating a constant-term offset of the analog temperature signal, wherein the constant-term offset is caused by at least one series parasitic resistance of the thermal sensor; and
an analog-to-digital conversion circuit for converting the analog temperature signal into a digital temperature signal in accordance with a reference level for conversion,
wherein the reference level for conversion is shifted in accordance with the calibration factor.
2. The circuit according to claim 1 , wherein:
the thermal sensor has a semiconductor pn junction such that the at least two currents sequentially flows through the semiconductor pn junction to generate at least two potential differences across the semiconductor pn junction for serving as the at least two output signals.
3. The circuit according to claim 1 , wherein:
the thermal sensor is formed in a substrate separate from the temperature measurement circuit, and
the calibration factor is provided to calibrate a temperature offset between the temperature detected by the thermal sensor and a representative temperature of the substrate.
4. The circuit according to claim 1 , wherein:
the analog-to-digital conversion circuit includes:
a sample/modulate circuit for generating a pulse train signal in response to the analog temperature signal, and
a counter for generating a counting result each predetermined period in response to the pulse train signal, the counting result being indicative of a number of pulses of the pulse train signal,
wherein the counting result increments from a ground value determined by the calibration factor.
5. The circuit according to claim 1 , wherein:
the current excitation current includes:
a measurement current source circuit for providing a first measurement current and a second measurement current;
a calibration current source circuit for providing a calibration current;
a calibration control circuit for allowing the first measurement current, the second measurement current, and the calibration current to be sequentially applied to the thermal sensor; and
a measurement control circuit for allowing the first measurement current and the second measurement current to be sequentially applied to the thermal sensor,
wherein the calibration control circuit is activated earlier than the measurement control circuit in order to calculate a constant-term offset for serving as part or all of the calibration factor.
6. The circuit according to claim 5 , wherein:
the first measurement current is A times the second measurement current, and
the second measurement current is A times the calibration current, where A is larger than zero.
7. A method of measuring a temperature comprising:
sequentially applying at least two currents to a thermal sensor, from which at least two output signals are correspondingly generated;
calculating an analog temperature signal in response to the at least two output signals, the analog temperature signal being representative of a temperature detected by the thermal sensor;
generating a calibration factor, wherein the calibration factor is calculated through sequentially applying at least three currents to the thermal sensor, and is used for calibrating a constant-term offset of the analog temperature signal, wherein the constant-term offset is caused by at least one series parasitic resistance of the thermal sensor; and
converting the analog temperature signal into a digital temperature signal in accordance with a reference level for conversion,
wherein the reference level for conversion is shifted in accordance with the calibration factor.
8. The method according to claim 7 , wherein:
the thermal sensor has a semiconductor pn junction such that the at least two currents sequentially flows through the semiconductor pn junction to generate at least two potential differences across the semiconductor pn junction for serving as the at least two output signals.
9. The method according to claim 7 , wherein:
the thermal sensor is formed in a substrate, and
the calibration factor is provided to calibrate a temperature offset between the temperature detected by the thermal sensor and a representative temperature of the substrate.