Analytical instruments, assemblies, and methods
View Patent ↗Instrument assemblies including a support coupled to an active substrate are provided with the support being configured to be coupled to an interior portion of an ionization chamber. Instruments are also provided that can include a chamber being configured to contact at least a portion of a sample with an ionization species. The instruments can also include an active substrate within the chamber. Analysis methods are provided that can include providing a sample to a chamber and selectively retaining at least a portion of the first analyte of the sample within the chamber without retaining at least a portion of the second analyte within the chamber. Analysis methods can also include providing a sample to a chamber housing an active substrate, contacting at least a portion of the sample with the substrate, and ionizing the portion of the sample.
1. An instrumental analysis method comprising:
providing an ionization chamber having an active substrate therein;
introducing a gaseous sample to within the chamber;
adsorbing at least a portion of the sample with the active substrate;
after the adsorbing, desorbing the portion of the sample from the active substrate;
after the desorbing, ionizing a component of the portion to form an analyte; and
determining the mass/charge ratio of the analyte.
2. The method of claim 1 wherein the ionization chamber is coupled to a mass separator and mass detector, the separator and detector configured to determine the mass/charge ratio of the analyte.
3. The method of claim 1 wherein the active substrate comprises silicon.
4. The method of claim 1 wherein the desorbing comprises heating the active substrate.
5. The method of claim 4 wherein the heating comprises providing ionization species within the ionization chamber.
6. An instrumental analysis method comprising:
providing a gaseous sample to within an ionization chamber having an active substrate and ion source therein;
contacting the gaseous sample with the active substrate to separate one portion of the gaseous sample from another portion of the gaseous sample, the portions having different components;
after the contacting, ionizing the one portion of the sample to form an analyte while retaining the other portion on the active substrate and unionized; and
determining the mass/charge ratio of the analyte.
7. The method of claim 6 wherein the active substrate is adjacent the ion source.
8. The method of claim 6 wherein the active substrate is comprised by a liner within the ionization chamber.
9. The method of claim 6 wherein the ion source has a discharge, and the discharge is at least partially framed by the active substrate.
10. The method of claim 9 further comprising heating the substrate with the discharge.
11. An instrumental analysis method comprising:
providing a multi-component gaseous sample to within an ionization chamber;
retaining one portion of the sample on an active substrate within the ionization chamber without retaining another portion of the sample, the sample portions having different components;
removing the other portion of the sample from the ionization chamber;
releasing the one portion of the sample from the active substrate;
after releasing the one portion, ionizing the one portion of the sample to form one analyte; and
determining the mass/charge ratio of the one analyte.
12. The method of claim 11 wherein the removing the other portion comprises ionizing the other portion to form another analyte, the analytes having different mass/charge ratios.
13. The method of claim 12 further comprising determining the mass/charge ratios of both the analytes.
14. The method of claim 11 wherein the retaining comprises concentrating the one portion of the sample on the active substrate.
15. The method of claim 11 wherein the one portion comprises a semi-volatile compound and the other portion comprises a volatile compound.