Two-dimensional silicon controlled rectifier
View Patent ↗A two-dimensional silicon controlled rectifier (2DSCR) having the anode and cathode forming a checkerboard pattern. Such a pattern maximizes the anode to cathode contact length (the active area) within a given SCR area, i.e., effectively increasing the SCR width. Increasing the physical SCR area, increases the current handling capabilities of the SCR.
1. A silicon controlled rectifier (SCR) comprising:
a plurality of anodes within a plurality of N-type material wells, respectively;
a plurality of cathodes within a plurality of a P-type material wells, respectively;
where the anodes and cathodes are arranged in an area of an integrated circuit in a checkerboard pattern, wherein each of the anodes comprises a P-type material and each of the cathodes comprises an N-type material;
an N-type material trigger tap positioned directly in the N-type material well of each of the anodes,
wherein the N-type material wells and the P-type material wells are substantially same in size and shape, and arranged alternately along each of two main directions that are substantially perpendicular to each other.
2. The SCR of claim 1 , wherein each of the anodes and cathodes in the pluralities of anodes and cathodes has a substantially square plan form.
3. The SCR of claim 1 , wherein each of the anodes and cathodes in the plurality of anodes and cathodes has a polygonal plan form.
4. The SCR of claim 1 , further comprising a P-type trigger tap positioned in the P-type material well of each of the cathodes.
5. The SCR of claim 1 , wherein either the P-type material wells of the cathodes or the N-type material wells of the anodes are connected.
6. The SCR of claim 1 , wherein a width of an active area that contributes to current flow from the anode to the cathode is defined by a well edge length minus Ln and Lp, wherein the well edge length is a physical length of the P-type material well or the N-type material well, Ln is a distance from an edge of the P-type well to an edge of the N-type cathode, and Lp is the distance from an edge of the N-type well to an edge of the P-type anode.
7. The SCR of claim 6 , wherein a summation of the widths of the active areas produces an effective width of the SCR.
8. The SCR of claim 6 , wherein the active area defines a current handling capability of the SCR.