IP Library Granted Patent US 7,584,070
Granted Patent B2
US 7,584,070 · App. 11/177,028 · Granted Sep 1, 2009

Testing/adjusting method and test control apparatus for rotating disk storage devices

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Quick Facts
Patent No.
US 7,584,070
App. No.
11/177,028
Granted
Sep 1, 2009
Kind
B2
Abstract

Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, and other test/adjustment steps are executed. Execution of the test/adjustment programs does not require a special test apparatus since they are executed in the magnetic disk device to be tested. In addition, the test/adjustment programs are formed up of multiple phases, and each phase is sequentially executed. Adoption of this program structure keeps the tests/adjustments clear from restrictions due to the data sizes and characteristics of the test/adjustment programs.

Claims (22)

1. A method for testing/adjusting a rotating-disk-type storage device connected to a host device via a data transmission path, the method comprising:

the host device transferring the test/adjustment program of a first phase that is stored within the host device, to the rotating-disk-type storage device;

the rotating-disk-type storage device executing the test/adjustment program of the first phase;

the host device detecting that the rotating-disk-type storage device is requesting a transfer of the test/adjustment program of a second phase that is stored within the host device; and

in response to the request in the detecting, the host device transferring the test/adjustment program of the second phase to the rotating-disk-type storage device.

2. The testing/adjusting method according to claim 1 , wherein the host device is a magnetic disk device operating in a host mode.

3. The testing/adjusting method according to claim 1 , wherein the test/adjustment program of the first phase includes a program for writing servo information into the rotating-disk-type storage device.

4. The testing/adjusting method according to claim 1 , wherein the test/adjustment program of the second phase includes a program for sending a command from the host device to the rotating-disk-type storage device and causing the rotating-disk-type storage device to execute the command.

5. The testing/adjusting method according to claim 1 , wherein the host device and the rotating-disk-type storage device are magnetic disk devices and wherein the testing/adjusting method comprises:

the host device transferring the test/adjustment program of the first phase and the test/adjustment program of the second phase to the rotating-disk-type storage device; and

the rotating-disk-type storage device, after receiving the test/adjustment program of the first phase and the test/adjustment program of the second phase from the host device, writing both of the programs onto a magnetic disk.

6. A method for testing/adjusting a first magnetic disk device and a second magnetic disk device, both connected to a host device via a data transmission path, the method comprising:

the host device transferring the test/adjustment program of a first phase that is stored within the host device, to the first magnetic disk device and the second magnetic disk device;

the first magnetic disk device and the second magnetic disk device executing the test/adjustment program of the first phase;

the host device detecting that the first magnetic disk device or the second magnetic disk device is requesting a transfer of the test/adjustment program of a second phase that is stored within the host device; and

in response to the request in the detecting, the host device transferring the test/adjustment program of the second phase to the first or second magnetic disk device requesting the transfer of the test/adjustment program of the second phase.

7. The testing/adjusting method according to claim 6 , wherein the data transmission path includes a SCSI bus.

8. The testing/adjusting method according to claim 6 , wherein the data transmission path includes an arbitrated loop of a fiber channel or a fabric switch of a fiber channel.

9. The testing/adjusting method according to claim 6 , wherein the data transmission path includes an ATA bus.

10. The testing/adjusting method according to claim 9 , wherein the data transmission path includes a test control apparatus for connecting the host device, the first magnetic disk device, and the second magnetic disk device, and establishing a communication path for either the first magnetic disk device or the second magnetic disk device with respect to the host device.

11. The testing/adjusting method according to claim 10 , wherein the test control apparatus is set as either a master or slave at one end, and wherein the first magnetic disk device and the second magnetic disk device are set as masters or slaves at the other end.

12. The testing/adjusting method according to claim 6 , wherein the host device operates in a host mode.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040819/0450 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 30, 2005
From: KOTANI, YASUHIRO; SUZUKI, HIROAKI; TAKASE, MAKOTO
To: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
Reel/Frame 016614/0732 →