Method for increasing the spectral and spatial resolution of detectors
View Patent ↗A method of optical detection of characteristic quantities of an illuminated specimen comprising detecting a signal that is backscattered, reflected and/or fluoresced and/or transmitted from the specimen by a spatially resolving detector wherein radiation coming from the specimen is imaged on the detector, shifting the position of the radiation which is measured in a spatially resolved manner relative to the detector and determining intermediate values by an algorithm from the signals measured in different shifts for purposes of increasing the spatial resolution of the detector. An arrangement for performing the method is also disclosed.
1. A method of optical detection of characteristic quantities of an illuminated specimen, comprising:
detecting a signal that is backscattered, reflected and/or fluoresced and/or transmitted from the specimen by a spatially resolving detector wherein radiation coming from the specimen is imaged on the detector;
shifting a position of the radiation which is measured in a spatially resolved manner relative to the detector
by alternately shifting a dispersive element, a scan unit and a displaceable detector;
determining and presenting intermediate values by an algorithm from signals measured in different shifts for purposes of increasing the spatial resolution of the detector.
2. A method of optical detection of characteristic quantities of an illuminated specimen, comprising:
detecting a signal that is backscattered, reflected and/or fluoresced and/or transmitted from the specimen by a spatially resolving detector wherein radiation coming from the specimen is imaged on the detector;
shifting a position of the radiation which is measured in a spatially resolved manner relative to the detector
by alternately shifting a dispersive element, a scan unit and the detector; and
determining and presenting intermediate values by an algorithm from signals measured in different shifts for purposes of increasing the spatial resolution of the detector;
wherein signals of detection channels are generated by at least one integrator circuit.
3. The method according to claim 1 , further comprising the step of scanning with an X-Y scanner arranged in an illumination path.
4. An arrangement for optical detection of characteristic quantities of an illuminated specimen, comprising:
a detector for detecting a signal that is backscattered, reflected and/or fluoresced and/or absorbed from the specimen, said detector being a spatially revolving detector wherein radiation coming from the specimen is imaged on the detector;
means for imaging the signal that is backscattered, reflected and/or fluoresced and/or absorbed from the specimen, on the detector;
means for shifting a position of the radiation which is measured in a spatially resolved manner relative to the detector
by alternately shifting a dispersive element, a scan unit and the detector;
means for determining and presenting intermediate values using an algorithm from signals measured in different shifts for purposes of increasing the spatial resolution of the detector.
5. An arrangement for optical detection of characteristic quantities of an illuminated specimen, comprising:
a detector for detecting a signal that is backscattered, reflected and/or fluoresced and/or absorbed from the specimen, said detector being a spatially revolving detector wherein radiation coming from the specimen is imaged on the detector;
means for imaging the signal that is backscattered, reflected and/or fluoresced and/or absorbed from the specimen, on the detector;
means for shifting a position of the radiation which is measured in a spatially resolved manner relative to the detector
by alternately shifting a dispersive element, a scan unit and the detector;
means for determining and presenting intermediate values using an algorithm from signals measured in different shifts for purposes of increasing the spatial resolution of the detector;
wherein signals of detection channels are generated by at least one integrator circuit.