Reinforced probes for testing semiconductor devices
A probe card assembly is provided. The probe card assembly includes a substrate and a plurality of probes bonded to a surface of the substrate. The probe card assembly also includes a reinforcing layer provided on the surface of the substrate. The reinforcing layer is in contact with a lower portion of each of the probes, where a remaining portion of each of the probes is free from the reinforcing layer.
1 . A probe card assembly comprising:
a substrate;
a plurality of probes bonded to a surface of the substrate; and
a reinforcing layer provided on the surface of the substrate, the reinforcing layer being in contact with a lower portion of each of the probes, a remaining portion of each of the probes being free from the reinforcing layer.
2 . The probe card assembly of claim 1 wherein the substrate is a space transformer.
3 . The probe card assembly of claim 1 wherein the reinforcing layer is an insulative material.
4 . The probe card assembly of claim 1 wherein the reinforcing layer comprises an epoxy material.
5 . The probe card assembly of claim 1 wherein the reinforcing layer includes tapered portions adjacent the probes, the tapered portions being thicker than a remainder of the reinforcing layer.
6 . The probe card assembly of claim 1 wherein the probes include a coating to reduce a potential for the reinforcing layer to extend up the probes beyond the lower portion.
7 . The probe card assembly of claim 1 further comprising a dam structure for defining a region of the substrate where the reinforcing layer is disposed.
8 . A method of processing a substrate comprising the steps of:
bonding a plurality of probes to a surface of the substrate; and
dispensing a reinforcing layer on the surface such that the reinforcing layer covers only a lower portion of each of the probes.
9 . The method of claim 8 further comprising the step of:
curing the reinforcing layer after the dispensing step.
10 . The method of claim 8 wherein the bonding step includes at least one of (1) wire bonding the probes to the surface of the substrate, (2) pick and place bonding the probes to the surface of the substrate, or (3) plating the probes on the substrate using masking techniques.
11 . The method of claim 8 wherein the dispensing step includes dispensing the reinforcing layer in a flowable state on the surface of the substrate.
12 . The method of claim 8 further comprising the step of:
providing a dam structure on the surface of the substrate prior to the dispensing step, the dam structure defining a region of the substrate where the reinforcing layer is to be disposed.
13 . The method of claim 12 wherein the providing step includes dispensing a dam structure material on the surface of the substrate and curing the dam structure material to provide the dam structure.
14 . The method of claim 13 wherein the dispensing step includes dispensing the reinforcing layer within the region defined by the dam structure.
15 . The method of claim 8 further comprising the step of:
applying a coating to at least a portion of each of the probes prior to the dispensing step such that a potential for the reinforcing layer to extend up the probes beyond the lower portion is reduced.
16 . The method of claim 8 wherein the dispensing step includes dispensing the reinforcing layer such that the reinforcing layer includes tapered portions adjacent the probes, the tapered portions being thicker than a remainder of the reinforcing layer.
17 . The method of claim 8 further comprising the steps of:
removing at least a portion of the reinforcing layer; and
applying another reinforcing layer to the surface of the substrate.
18 . The method of claim 17 wherein the step of removing includes immersion of at least a portion of the substrate into a solution, the solution facilitating removal of the portion of the reinforcing layer.